短路測試 的英文怎麼說

中文拼音 [duǎnlùcèshì]
短路測試 英文
short circuit test
  • 短 : Ⅰ形容詞（空間、時間兩端之間的距離小） short; brief Ⅱ動詞（缺少; 欠） lack; owe Ⅲ名詞1 （缺點） we...
  • 路 : 1 （道路） road; way; path 2 （路程） journey; distance 3 （途徑; 門路） way; means 4 （條理） se...
  • 測 : 動詞1. （測量） survey; fathom; measure 2. （測度; 推測） conjecture; infer
  • 試 : 名詞（古代占卜用的器具） astrolabe
  • 短路 : [電學] short; short circuit; cutting out; direct short; short out; short pass短路保護（裝置） sho...
  • 測試 : test; testing; checkout; measurement
  1. Monitor apparatus can measure valid value of three phase voltage and current, power factor, three phase disequilibrium, instant flecker of short time and harmonic without twenty, degree and harmonic distortion total. the paper are laid on the following. ( 1 ) master plan and function of circuit, ( 2 ) hardware design including circuit and principle of a / d conversion, phase lock, liquid crystal display and keystroke and so on, ( 3 ) design of system software including digital filtering, fft, a / d conversion and monitor interface of pc, ( 4 ) system test

    監測儀能夠完成包括三相電壓、三相電流的有效值、功率因數、三相不平衡、電壓短期閃變、以及20次內的諧波、諧波相位、諧波失真總量等的測量。論文重點介紹了以下幾部分： （ 1 ）電路的總體設計和功能； （ 2 ）硬體設計，包括a d轉換、鎖相環、液晶顯示和按鍵輸入等原理和電路。 （ 3 ）系統軟體設計，包括a d轉換、 fft 、數字濾波等程序的原理和演算法以及上位機監控界面的設計； （ 4 ）系統測試。
  2. Shorts may cause a pcb to fail other tests and may damage the tester or the board under test if you must apply power to the board

    短路可能導致印刷電路板不能通過其它測試，在對電路板上電后，會損壞測試設備或電路板。
  3. The majority of the test vectors are used to check the connection of the pins of the device. those vectors for connection test can be removed from the vector base for the device under test when deltascan is applied together with boundary scan test. the total vectors are therefore eliminated

    測試矢量中大多數是用於測試引腳之間是否有短路或有引腳開路情況的，引入deltascan測試ic的引腳的開路和短路情況后，就可從xc5210 _ tq144的測試矢量集中去掉合併與短路，開路測試有關的測試矢量，進一步減少了邊界掃描所需的測試矢量。
  4. The first test an in - circuit tester performs is a shorts - and - opens test

    在線測試完成的第一項測試任務就是短路、開路測試。
  5. After performing the shorts and opens test, the in - circuit tester tests each component on a pcb assembly one at a time

    在線測試完成的第一項測試任務就是短路、開路測試。
  6. During that short period, the tester must also capture the output value of the ic

    在這個過程中，對輸入端施加一個短時的比邏輯值高的電流，同時測試儀器要捕捉到集成電路的輸出值。
  7. High - voltage fuses. part 3 : determination of short - circuit power factor for testing current - limiting fuses and expulsion and similar fuses

    高壓熔斷器.第3部分:試驗限流熔斷器和排氣式及類似型式熔斷器的短路功率因數的測定
  8. Research on surface and grain boundary passivation mechanism obtained effects of surface recombination on crystalline silicon solar cell performance and the theoretical expression of grain boundary recombination velocity. the limit ratio of short - circuit current increment for anti - reflection coating utilization on solar cells was obtained. the crystalline silicon solar cell spectral response, contact resistance and minority carrier lifetime measurement systems were established

    鈍化機理研究獲得了表面復合對不同表面摻雜濃度晶體硅太陽電池性能的影響、表面和界面復合速度的理論表達式；研究得到了減反射膜對太陽電池短路電流增量比的極限；建立了太陽電池光譜響應、柵線電極接觸電阻和少子壽命等測試系統。
  9. However, the refractive index will increase with the increase of the flow ratio of sifu / nhs, slightly increase with the increase of substrate temperate, and decrease with the increase of rf power. by measuring the passivation results of hydrogen plasma and sinx thin film, we found an evident improvement of minor carrier lifetime in polycrystalline silicon after hydrogen plasma treatment, although it has little to do with the annealing temperature and time. the hydrogen contained in sinx thin film can enhance the carrier mobility of monocrystalline silicon, but after annealing at high temperature the mobility turns down

    通過測試氫等離子體鈍化和氮化硅薄膜鈍化的效果，實驗還發現氫等離子體處理對多晶硅材料的少子壽命提高作用比較明顯，但是這種提高作用與處理溫度以浙江大學碩士學位論文王曉泉2003年5月及時間的關系不大；氨化硅薄膜中的氫對單晶硅的載流子遷移率提高有一定作用，但經過高溫處理后這種作用消失；氮化硅薄膜能提高單晶硅和多晶硅的少子壽命，具有表面鈍化和體鈍化的雙重作用；氫等離子體和氮化硅薄膜都能有效地提高單晶和多晶電池的短路電流密度，進而使電池效率有不同程度（絕對轉換效率0
  10. This paper considers two controllers with different feedback signals ? the ac current phase angle of converter transformer and the ac voltage magnitude of inverter bus, respectively. pscad / emtdc simulation software is used for the controller testing. the test models used for the analysis are the cigre hvdc benchmark systems with different scr at the inverter side

    為了驗證該控制方式的有效性，本文採用了電磁暫態模擬軟體pscad emtdc ，在國際大電網會議cigre提出的hvdc標準模型上，用逆變側短路比不同的系統對調制控制器的性能進行了模擬測試，調試出了調制控制器的各參數值。
  11. Audible continuity check diode test

    短路測試二極體測試功能
  12. B. open short test card merits

    短路測試卡開短路測試板優點如下
  13. Open - short test card cv13 - 3456 costronic

    開短路測試卡
  14. Open - short test card cv1354 costronic

    開短路測試卡
  15. Opens short - circuits the test machine

    開短路測試機
  16. Open short test card cv11s2 costronic

    短路測試卡
  17. B. open - short test card merits

    短路測試卡
  18. Functions ac dc voltage, ac dc current, resistance, diode test and continuity beeper

    交直流電壓交直流電流電阻二極體測試和短路測試功能
  19. 8 functions ac dc voltage, ac dc current, resistance, capacitance, diode test and continuity beeper

    交直流電壓交直流電流電阻電容二極體測試和短路測試功能
  20. It also has perfect functions of rated voltage, rated current, rated power and rated resistance, remote measurement, short - circuit measurement, battery measurement, dynamic measurement, and upper engine ' s software control

    其完善的定電壓，定電流，定功率，定電阻功能，遠端測量，短路測試，電池測試，動態測試及上位機軟體控制等功能讓您獲得一機多用的實惠與方便。
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