遷移電子效應 的英文怎麼說
中文拼音 [qiānyídiànzixiàoyīng]
遷移電子效應
英文
transferred electron effect- 遷 : Ⅰ動詞1. (遷移) move 2. (轉變) change 3. (古時指調動官職) be appointed to a certain post Ⅱ名詞(姓氏) a surname
- 移 : Ⅰ動詞1. (移動) move; remove; shift 2. (改變; 變動) change; alter Ⅱ名詞(姓氏) a surname
- 電 : Ⅰ名詞1 (有電荷存在和電荷變化的現象) electricity 2 (電報) telegram; cable Ⅱ動詞1 (觸電) give...
- 子 : 子Ⅰ名詞1 (兒子) son 2 (人的通稱) person 3 (古代特指有學問的男人) ancient title of respect f...
- 效 : Ⅰ名詞(效果; 功用) effect; efficiency; result Ⅱ動詞1 (仿效) imitate; follow the example of 2 ...
- 應 : 應動詞1 (回答) answer; respond to; echo 2 (滿足要求) comply with; grant 3 (順應; 適應) suit...
- 遷移 : move; remove; migrate; shift; transport; migration; transference; removal
- 電子 : [物理學] [電學] electron
- 效應 : [物理學] effect; action; influence
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Strained - soi mosfet, which appears recently, takes both the advantages of soi ( silicon on insulator ) and sige ( silicon germanium ). it has shown advantages over bulk sample in enhanced carriers mobility, as well as higher transconductance, stronger drive capability and reduced parasitic capacitances. these properties make it a promising candidate for improving the performance of microelectronics devices
Strained - soimosfet是最近幾年才出現的新型器件,它將soi材料和sige材料結合在一起,與傳統體硅器件相比,表現出載流子遷移率高、電流驅動能力強、跨導大、寄生效應小等優勢,特別適用於高性能、高速度、低功耗超大規模集成電路。Measured results showed that the dl - a device with its structure as following ito / npb / alq / mg : ag was far more superior to sl device with the structure of ito / alq / mg : ag because the dl - a device better balanced energy band between each each layer and the mobility of carriers ( electrons and holes ), which led to the combination of carriers taking place in the bulk of emitter and avoided the excitons being eliminated by the electrodes which easily occurs in sl devices. as to the doped devices, measurements demonstrated an excellent device with its maximum brightness was 25000cd / m2
研究結果表明, dl - a型雙層結構器件ito / npb / alq / mg : ag的各項性能指標明顯優于單層器件ito / alq / mg : ag ,因為前者有更好的載流子遷移率匹配以及能帶匹配,因此平衡了復合的載流子數目,並且能將復合區有效控制在發光層內部,有效避免了表面的大量缺陷以及電極猝滅效應,提高了載流子的復合效率,從而提高了器件的發光性能。Atoms in the solder joints move as a result of both diffusion and electromigration
另一方面,擴散和電遷移效應,則造成焊點中的原子移動。The conclusion is that under the neutron and 7 - ray synthetical irradiation environment of a reactor, ionization effects of neutron on the vlsi made with cmos technology are weak, and that the displacement effects of neutron induces the decreases of mobility ratio and density of charge carrier, which causes the decrease of the total static current, so it compensates the increase of the static current caused by the synthetical ionization effects of neutron and - ray
對試驗結果綜合分析得出:在反應堆的綜合輻照環境下,中子電離效應較弱,並且由於中子位移效應引起載流子遷移率降低和載流子濃度降低,使得總的靜態電流下降,從而抵消中子和射線綜合電離導致的靜態電流增長。Based on gan hemt device physics and experiment results, we found electron mobility is depend on sheet density of 2deg and proposed a new gan hemt current collapse physical model
基於ganhemt器件物理和實驗分析測試結果,發現電子遷移率與二維電子氣濃度有關,並提出了一種gan電流崩塌效應的新物理模型。This model described relationship of current collapse and traps in buffer layer, and the normalized product of electron mobility and 2deg density with and without current collapses was 0. 95 vgs
該模型描述了電流崩塌效應與緩沖層中陷阱的相互關系,並獲得了電流崩塌前後遷移率與二維電子氣濃度乘積的歸一化值0 . 95 vgs 。分享友人