離子質譜 的英文怎麼說

中文拼音 [lízizhípǔ]
離子質譜 英文
ion mass spectrum
  • 離 : Ⅰ動詞1 （離開） leave; part from; be away from; separate 2 （背離） go against 3 （缺少） dispens...
  • 子 : 子Ⅰ名詞1 （兒子） son 2 （人的通稱） person 3 （古代特指有學問的男人） ancient title of respect f...
  • 質 : Ⅰ名詞1 （性質; 本質） nature; character; essence 2 （質量） quality 3 （物質） matter; substance;...
  • 譜 : Ⅰ名詞[書面語]1 （按類別或系統編成的書或冊子等） table; chart; register 2 （指導練習的格式或圖形）...
  • 離子 : [物理學] ion
  1. The fabrication parameters were preliminarily optimized. the morphology and composition of the samples of the diamond film for different b / c ratios was investigated by scanning electron micrograph ( sem ) and raman scattering spectroscopy ( raman ). the content of different levels of b dopant in the diamond film was tested by secondary ion mass spectrometry ( sims )

    闡述了摻硼金剛石膜的制備工藝，研究了摻硼金剛石膜成核和生長的影響因素，初步優化了沉積摻硼金剛石膜工藝參數，同時對摻硼金剛石膜進行了掃描分析、拉曼分析、二次離子質譜分析和電阻率測試。
  2. Standard test method for isotopic abundance analysis of uranium hexafloride by multi - collector, inductively coupled plasma - mass spectrometry

    多收集器感應耦合等離子質譜法分析六氟化鈾同位素豐度的標準試驗方法
  3. In the paper the structure and principle of the secondary ion mass spectrometry ( sims ) are reported, and its typical applications in the hgcdte material and devices processing, especially in the measurement of the junction depth and the quantity analysis of trace impurity are introduced

    摘要文章介紹了二次離子質譜儀的結構及其基本工作原理，並通過對典型應用的分析，介紹了二次離子質譜分析技術在高靈敏度碲鎘汞紅外焦平面探測器材料和器件制備工藝中的作用，特別是在結探監測和微量雜質監控方面所發揮的重要作用。
  4. The sims showed that the result of the concentration and the abundance ratio of li - 7 and li - 6 in the palladium wire were changed. it implied that the laser triggering on a pd wire with a low gas - loading ratio may have produced the nuclear process

    並通過二次離子質譜儀（ sims ）測出了鈀絲中鋰- 7和鋰- 6的濃度變化和豐度比變化，說明在低充氫率的鈀絲中，在小功率激光的觸發下有產生核過程的可能。
  5. Secondary ion mass spectrometer

    二次離子質譜計
  6. By sims method, we analyzed the profile distribution of mn and c, found that increasing the annealing temperature is beneficial to the diffusion of mn, but has no influence to c. mfm and squid measurements demonstrate that sub micron single - domain magnetic mnas particles found in sample annealing at 850 for 15s show ferromagnetism at room temperature and have a high curie temperature more than 300k

    利用二次離子質譜方法對mn和c在樣品中的分佈進行了研究，發現退火溫度的上升，有利於mn的擴散；而對c的分佈影響較小。利用磁力顯微鏡和超導量子干涉儀對樣品的磁性質進行了研究。發現在850 + 15s退火處理的樣品中形成了亞微米級單疇磁性mnas粒子；經測試其在室溫下呈現出鐵磁性，居里溫度在300k以上。
  7. The room for the following equipments need the air - conditioning : uv - spectrophotometer, fluorescence spectrometer, gc, gc - ms, aas, afs, icp, icp - ms, hplc, hplc - ms, ion chromatography, atomic fluores - cence spectrometer, pcr amplification and balance

    12紫外/可見分光光度儀、熒光分光光度，氣相色譜，氣相色譜質譜、原子吸收，原子熒光儀、等離子發射光譜、等離子質譜、高效液相、液相色譜質譜、離子色譜、熒光光度、 pcr核酸擴增儀以及天平室安裝空調。
  8. The sims, ir and raman analysis results show that the tritium permeation barrier ( tpb ) is formed when tic and sio2 films are annealed in hydrogen at about 350 ?

    利用二次離子質譜（ sims ） 、紅外吸收光譜（ ir ）及激光喇曼光譜（ raman ）技術，證實了tic和sio2在350左右的氫中退火可形成防氚滲透阻擋層。
  9. Surface chemical analysis - secondary - ion mass spectrometry - determination of relative sensitivity factors from ion - implanted reference materials

    表面化學分析.次級離子質譜法.測定離子注入標樣的相對靈敏系數
  10. Sims measuring widths of interfaces in sputter depth profiling using sims

    用次級離子質譜法
  11. Ion mass spectrum and its application continue

    離子質譜及其應用續
  12. Secondary ion mass spectrometry

    二次離子質譜法
  13. Simultaneous determination of multiple poison in biological samples by time - sharing gc ms sim

    用分時選擇離子質譜法一次檢測多種藥物
  14. Surface chemical analysis - information format for static secondary - ion mass spectrometry

    表面化學分析.靜態次生離子質譜法的信息格式
  15. Surface chemical analysis - secondary ion mass spectrometry - determination of boron atomic concentration in silicon using uniformly doped materials

    表面化學分析.次級離子質譜法.利用均勻摻雜材料測定硅中硼原子濃度
  16. Surface chemical analysis - secondary - ion mass spectrometry - method for estimating depth resolution parameters with multiple delta - layer reference materials

    表面化學分析.次級離子質譜法.多層標準材料深度溶解參數的估算方法
  17. Among the destructive techniques able to provide the desired depth resolution the most widely used technique is secondary - ion - mass spectroscopy ( sims )

    在可以提供所希望的縱向解析度的損傷技術中，最廣泛運用的是二次離子質譜（ sims ） 。
  18. When rees widely enter into environment and human body inevitably, peoples begin to pay more attention to the accumulation of rees in organism and the effect on the health of human body, this research consists of two parts : in the first part, the distributing rule of la and y in different tissues and organs were studied by adopting inductively coupled plasma mass spectrometer after organism absorbed it

    本研究內容分為兩部分： （一）採用電感耦合等離子質譜技術研究了生物體攝入輕稀土元素鑭和重稀土元素釔后在不同組織器官的分佈規律，同時測定了經稀土元素處理后的生物體的早期生物量，並就稀土元素的攝入量與組織器官內的積累量進行了相關性分析。
  19. In this paper, germanium concentration in ge - dopped silicon bulk single crystals was measured by the methods of indution couple plasma ( icp ) direct reading spectrometer, sims, sem - edx, and the effective segregation coefficent of germanium under the situation of the changed speed was calculated, the result was 0. 62. according to the result, the curves of different ge concentrations were got

    本論文利用二次離子質譜（ sims ） 、化學分析法（電感耦合等離子體（ icp ）直讀光譜儀） 、掃描電鏡能譜儀（ sem - edx ）三種方法對不同摻鍺濃度的czsige單晶中鍺含量進行了測試，並對變速拉晶條件下鍺的有效分凝系數進行了計算，得出鍺的有效分凝系數（ ke ）為0 . 62 。
  20. The main work includes four contents as follow : 1 ) the electrodes annealed in various temperatures were studied. with x - ray diffraction spectroscopy ( xrd ) and sims, the interfacial reaction is analyzed and a new two - step annealing method is suggested

    研究了al單層電極及ti al雙層電極與藍寶石基gan在不同退火條件下的歐姆接觸情況，並用x射線衍射譜（ xrd ） ，二次離子質譜（ sims ）對界面固相反應進行了分析。
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