電路測試技術 的英文怎麼說

中文拼音 [diànlùcèshìjìshù]
電路測試技術 英文
circuit measurement technology
  • 電 : Ⅰ名詞1 （有電荷存在和電荷變化的現象） electricity 2 （電報） telegram; cable Ⅱ動詞1 （觸電） give...
  • 路 : 1 （道路） road; way; path 2 （路程） journey; distance 3 （途徑; 門路） way; means 4 （條理） se...
  • 測 : 動詞1. （測量） survey; fathom; measure 2. （測度; 推測） conjecture; infer
  • 試 : 名詞（古代占卜用的器具） astrolabe
  • 技 : 名詞（技能; 本領） skill; ability; trick; technique
  • 術 : 術名詞1. （技藝; 技術; 學術） art; skill; technique 2. （方法; 策略） method; tactics 3. （姓氏） a surname
  • 電路 : [訊] circuit （ckt）; electric circuit; electrocircuit電路板 circuit board; 電路保持 guard of a c...
  • 測試 : test; testing; checkout; measurement
  1. This paper starts the research of the liquid floated pendulous accelerometer testing system according to the engineering. at first, this paper gives the brief introduction of the history and present status of accelerometer and its testing technology, the working principium and math model of the liquid floated pendu - lous accelerometer, and then, decides the binary width pulse force retrim loop as the design proposal of testing system, researches the transfer function of every part in the system emphasizly, analyses the stability of the whole accelerometer testing system from the angle of control theoretics by the open loop transfer function of system, and designed the correcting net, analyses the basal problems such as resolution, sampling restraint, precision and so on, designs the hardware testing circuits such as preamplification, band - pass filter, alternating amplifier, phase sensitive demodulatorn, pulse - width modulation, frequency scale circuit, moment current generator. finally, using the graphics program language labv - iew which is designed for testing field especially by ni accomplishes the solfware design of testing system, realized the testing functions

    首先對加速度計及其測試技術的發展歷史和現狀，液浮擺式加速度計的工作原理和數學模型等作了簡要的介紹，然後確定了以二元調寬脈沖再平衡測試迴路為設計方案，並從控制理論的角度進行了分析，著重研究了系統中各部分的傳遞函數，利用系統開環傳遞函數分析了系統的穩定性，同時設計了系統的校正網路;分析了二元調寬脈沖再平衡測試迴路的解析度、采樣約束以及測試精度等基本問題，並按照系統分析的結果設計了包括前置放大、帶通濾波、交流放大、相敏解調、脈寬調制、頻標電路以及力矩電流發生器等測試系統各部分硬體電路，驗證了電路的正確性，最後按照測試系統的要求，採用了美國ni公司專為測試領域所開發的虛擬儀器工具? ? labview作為測試軟體開發工具，利用該圖形化編程語言完成了測試系統軟體部分的設計，實現了測試功能。
  2. Especially, the characteristic of even - harmonic mixer is analyzed and design technique to control the phase characteristic of the mixer is presented. the mixer circuits are designed ; the results of simulation and experiment test are compared and analyzed

    討論了利用eda工具的電路設計技術，利用hpads 、 ansoft軟體完成了電路設計、模擬和製作了上述器件，並把電路模擬和場模擬以及測試結果進行了比較和分析。
  3. Fundamentals of circuit measurement technology

    電路測試技術基礎
  4. Circuit measurement technology experiments

    電路測試技術及實驗
  5. Circuit measurement technology

    電路測試技術
  6. Criuit measurement technology

    電路測試技術
  7. With the development of manufacturing technology of digital integrated circuit, the voltage test method based on stuck - at fault model can not detect all the faults in modern integrated circuit

    隨著集成電路製造技術的發展，基於固定型故障模型的電壓測試技術越來越不能滿足高性能集成電路的需求。
  8. Research on the test technology of sequential logic circuits in the control system of magnetic bearings of hard disk drives

    磁懸浮硬盤轉子控制系統中時序電路測試技術
  9. Higher mathematics, visual basic programming design, fundamentals of law, linear algebra ， fundamentals of, computer application, physical education, computer networks and communication, c + + with object - oriented, programming, data structures, philosophy and political theory, programming in c language, operating systems, software test technology, relations on business, digital logic circuit, international software development, social analysis and government policy, introduction to java visual foxpro database systems and program design, e - business, introduction to programming with an application framework, software engineering, introduction to web page design and programming

    高等數學、大學計算機應用基礎、程序設計教程軟體工程、用戶界面設計、電子商務、軟體工程、數據庫應用與程序設計、線性代數、編碼理論基礎、信息管理基礎、軟體成本估算、質量管理、計算機軟體技術基礎、實用軟體體系基礎、大型軟體體系結構、軟體測試技術、客戶關系管理、電子商務、國際化軟體開發、現代項目管理、計算機網路與通信。
  10. Bist is an efficient solution for the testing of soc. it is built up with prompting and responding circuits and these two parts are added to the circuit being tested so that the engineer need not consider the testing vector, for it ' s generated automatically

    而內嵌自測試技術對于解決soc生產測試的問題非常有效，它將一個激勵電路和響應電路中加到被測電路中，從而使測試人員不必再考慮測試向量的問題，因為它是自動生成的。
  11. This paper mainly accomplished the following research : summarize the classify and application fields of four - probe testing technology ; take the square four - probe testing technology study by using the advantage of rymaszewski method in auto - eliminating the portrait wandering influence to induct ry method to square - probe testing method ; deeply study the influence of probe wandering to progressed ry method testing result ; complete the design of testing panel and testing circuit, realize the auto - testing of mono crystal wafer ; discuss the image enhancement and threshold selection problem in image identify, and finally accomplish the identify of probe pinpoint. the main new view points of the research : 1. it is the first time for applying image manipulation and analysis technique to the sheet resistance measurement, and achieving the auto - location function of the probe

    為此，本文開展了以下研究工作：綜述了四探針技術的分類以及應用范圍；對方形四探針測試技術進行了研究，利用rymaszewski法自動消除探針縱向游移影響的優點，將它應用於方形探針測試法中，並對探針游移對改進rymaszewski法測試結果的影響進行了深入探討，提出了用圖像識別技術監測測試進行的方法；完成了測試系統的測試平臺以及測試電路的設計，研製出具有圖像識別功能的斜置式方形探針分析儀一臺，實現了矽片電阻率測試的自動化；對圖像識別過程中涉及到的圖像增強和閾值選擇問題進行了論述，最終實現了對探針針尖的圖像識別以及探針測試結構的自動調整，保證了方形探針測試儀的測試精度。
  12. The current based test method can be divided into two categories, the one is quiescent current test ( iddq testing ) and the other is transient current test ( iddt testing )

    為了降低測試成本並且提高集成電路的可靠性，電流測試應運而生。電流測試技術包括穩態電流測試（ iddqtesting ） 、瞬態電流測試（ iddttesting ）兩種方法。
  13. As the development of microwave technology and the universal use of vlsi ( very large scale integration ) and ulsi ( ultra large scale integration ), traditional automatic testing technology for pcb ( printed circuit board ) is faced with a rigorous challenge

    隨著微波、毫米波技術的發展以及超大規模集成電路（ vlsi ） 、極大規模集成電路（ ulsi ）的相繼誕生和廣泛應用，傳統的電路板自動測試技術受到了前所未有的挑戰。
  14. Based upon basic principles of the analog integrated circuit and theories of system stability, this paper deals with high precision, wide band - width and fully differential cmos operational transconductance amplifiers ( ota ). other than discussions about its performance evaluation and testing, a two - stage full differential ota has also been designed including its core cell and the overall layout

    基於模擬集成電路基本理論與系統穩定原理，論文針對高精度、寬帶寬cmos全差分運算放大器（ ota ）進行了性能指標及測試技術探討，並研究設計了cmos全差分共源共柵兩級ota 、核心單元與總體電路版圖。
  15. With the rapid development and application in electronic measurement technology and instruments of micro - electronics technology, computer technology, software technology and network technology, new measurement theory, new measurement method, new measurement fields and new instrument architecture continually come forth and the function and effect of electronic instruments have given birth to quality change and resulted in the conception of instrument broken in many aspects

    隨著微電子技術、計算機技術、軟體技術、網路技術的高度發展及其在電子測量技術與儀器上的應用，新的測量理論、新的測試方法、新的測試領域以及新的儀器結構不斷的出現，在許多方面已經沖破儀器的概念，電子測量儀器的功能和作用發生了質的變化。
  16. This thesis discusses the realization of pcbs ict production through a concrete example in which boundary scan technology is applied, and presents a new method to improve the test speed, based on the analysis of boundary scan circuit and means for vector creation. he applys boundary scan ( bs ) to boundary - scan device on the board where bs features by easy vector creation, need less knowledge of the device

    本文結合一個具體電路板在線測試實現，首先討論了在ict中，採用邊界掃描元件測試技術實現在線測試生產；並在分析歸納各種測試方法的基礎上探索一種新的改進方法，即將deltascan技術與邊界掃描技術相結合以減少測試矢量，增加測試速度的一種實用方法。
  17. From the view point of the foundation of dft ( which includes the testable measure of gate - level circuits, the testable and controllable measure of functional - level, the flow and methodology of dft and so on ), the author introduce some common testing technology such as scan and bist in modern times. especially the boundary scan technology has been widely adopted in the dft of vlsi. with the special controller, the testing vector could be scanned to the corresponding ports of inner cores from the testing input ports, and the response could also be shifted to the testing output ports

    本文從可測性設計的基礎理論出發（包括門級電路的可測性測度、功能級上的可測性和可控性、可測性設計的流程和方法等） ，介紹了現代常用的可測性技術，比如：掃描技術、內嵌自測試技術等，特別是邊緣掃描技術已經廣泛地應用到vlsi的可測性設計之中，它通過特定的控制器，從相應的測試輸入埠將測試向量掃描至芯核所對應的管腳，再將結果從相應的測試輸出埠掃出。
  18. The main contents are as follows : the structure of mixed - signal circuit which newly - defined in ieee1149. 4 std is analyzed in detail, especially anolog boundary module and test bus interface circuit. on the basis of mixed - signal boundary scan technology, a scheme of mixed - signal boundary - scan test system is presented and the hardwares are implemented, including the controller and display unit

    主要研究的內容以及所作的工作如下:詳細分析了ieee1149 . 4標準中針對混合信號電路測試新增的結構，即模擬邊界模塊及測試介面電路。基於混合信號邊界掃描技術標準，提出混合信號邊界掃描控制器的設計方案並實現了其硬體設計，包括邊界掃描控制模塊、顯示驅動模塊等。
  19. Four - point probe measurement technique is one of the most extensive means for examining the resistivity in the semiconductor industry. with continuous progress, semiconductor industry develops at a very fast speed, the integration level of ic becomes higher and higher. presently, the ic production is entering into the age of ulsi, then testings are more and more important

    四探針測試技術是半導體工業檢測電阻率時採用最為廣泛的測試手段之一。隨著時代的不斷進步，半導體產業飛速發展，以單晶矽片為襯底的集成電路集成度越來越高，目前正進入甚大規模集成電路（ ulsi ）時代，測試在整個集成電路生產過程中的地位越來越重要。
  20. As a design for test technology, the boundary - scan test fixes a special element called boundary - scan cell ( bsc ) between the device input pins and the core logic inputs, or between the core logic outputs and the device output pins

    作為一種結構插入的可測性設計技術，邊界掃描測試技術將邊界掃描測試單元（ boundery - scancell ， bsc ）插在集成電路內部每一個輸入輸出引腳上。
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