electron scanning 中文意思是什麼

electron scanning 解釋
電子掃描
  • electron : n. 【物理學】電子。 the electron beam 電子束。 the electron theory 電子(學)說。
  • scanning : n. 1. 細看,細察,審視。2. 【電視】掃描,掃掠,搜索。
  1. Equal channel angular processing of the pearlitic steel ( 0. 65 wt. % c ) was successfully carried out at 650 with route c in this study, obtaining a total equivalent true strain ~ 5. the microstructure evolution of pearlitic steel in ecap was investigated by means of transmission electron microscope and scanning electron microscope. the main results are as the following : 1

    本研究成功地實現了c方式650珠光體鋼65mnecap變形,累積等效真應變達到5 。並用透射電鏡、掃描電鏡研究了珠光體組織的演變特點和滲碳體的變形。主要結果如下: 1
  2. This colorized scanning electron micrograph shows pollens ? bermuda grass in green, maple in red, and rag weed in yellow ? at roughly 3, 000 times their itchy, sneezy life size

    這是彩色掃描電子顯微圖,上面顯示的是各種花粉,綠色的是百慕大草,紅色的是楓木,黃色的是雜草。大概放大到了它們自身的3000倍,跟人的噴嚏一樣大!
  3. Chiral quaternary ammonium salts were synthesized from cinchonine in cinchona alkaloids using chloromethylated polystyrene - polyethylene glycol, diethylene glycol, triethylene glycol and glycol as polymer - supported phase transfer catalysts, finsl products were characterized by ftir, elemental analysis, scanning electron microscopy, x - ray photoelectron spectroscopy ( xps )

    摘要以金雞納生物堿中的辛可寧為原料,氯甲基化聚苯乙烯聚乙二醇、一縮二乙二醇、二縮三乙二醇、乙二醇等為載體合成了幾種聚合物負載的手性季銨鹽,並對它們的結構用紅外光譜、元素分析、掃描電鏡和x射線光電子能譜等測試手段進行了表徵。
  4. By using laser light scattering ( lls ) and scanning electron microscopy ( sem ), the particle sizes of ultrafine silicon dioxide diminish and the congeries dispersibility were obviously improved, which shows that the hydrophobic property of ultrafine silicon dioxide after being modified has been much more strengthened, this surface modification provides wide market to reuse ultrafine silicon dioxide waste material

    表明超細二氧化硅顆粒表面鍵合了疏水性有機分子鏈,蔬水性增強,達到了改性目的,為超細二氧化硅廢料的回收利用提供了廣闊的市場。
  5. The results of x - ray photoelectron spectrum ( xps ) demonstrated the ce ions in pure phase ce : yig ( x < 0. 2 ) were in the state of trivalence. scanning electron microscope ( sem ) analysis showed conglobation of yig and ce : yig particles, whose size were smaller than 1 urn

    Xps的分析結果顯示單相ce : yig ( x 0 . 2時)中ce離子是以正三價的狀態存在,這與物相分析結果是一致的。
  6. Scanning electron microscope observation of cysticercus cellulosae treated with dazolum drugs in vitro

    苯駢咪唑類藥物對豬囊尾蚴體外作用的光鏡和掃描電鏡觀察
  7. The scanning electron microscopic observation on cysticercus cellulosae treated with chinese materia media of compound mienangling and simple prescription in vitro

    中藥復方與單方對豬囊尾蚴體外抑制作用的掃描電鏡觀察
  8. Microcosmic morphology of prepared membranes observed by a scanning electron microscopy ( sem ) show that the nanofiltration membrane has a dissymmetrical structure

    採用掃描電子顯微鏡( sem )觀察了膜的微觀形態結構,表明所制納濾膜具有典型的不對稱結構。
  9. Ebs electron beam scanning system

    電子束掃描系統
  10. Environmental scanning electron microscopy ( esem ) observation of f2 mycelium cultured in liquid medium with 100mg / l of cadmium showed that there were crystalline precipitations attached to the surface of f2. transmission electron microscopy ( tem ) and energy - dispersive analysis microscope ( edam ) examination revealed that there were many granules with high content of cadmium around the cell wall

    F2在100mg l鎘濃度下培養后,經環境掃描電鏡( esem )觀察顯示,菌體表面有較大晶體狀沉澱物;透射電鏡( tem )和能譜分析( edam )表明,細胞壁周圍形成大量細小的高鎘含量沉澱物。
  11. The silicon plates are formed reverse four wimble array in koh solution by wet - etching technology. then the electrochemical etching experiments are done in three poles electrobath. and some technology questions such as heat oxygenation, light etching, wet etching and electrochemical etching have been analyzed. at the same time sample appearances are analyzed by scanning electron microscope. according to current burst model theory, the electrochemical deep holes etching mechanism are analyzed

    在三極電解槽中,進行了電化學深刻蝕的探索性實驗。對氧化、光刻、濕法刻蝕和電化學刻蝕中的工藝問題進行了初步的理論和實驗研究,同時,採用sem對實驗樣品進行了形貌分析,並採用電流突破模型對電化學深孔刻蝕機理進行了理論分析。
  12. Tensile properties and impact properties measurements were done at room temperature. the volume resistivity of rectangular samples was measured using a zc36 electrometer and a high 240a voltage supply, for samples with a low resistivity level a dt - 9205b digital multimeter was used, silver paint was applied to ensure complete contact between sample and electrodes, namely, to eliminate the contact resistance. the phase morphology of blends was also studied using a jeol jsm - 5900lv scanning electron microscope ( sem )

    體積電阻率的測定:當r _ v 10 ~ 8時,製成100 100 4mm板材,用zc36型高阻儀測量;當r _ v 10 ~ 8時,用dt - 9205b型數字式萬用表測試試樣的體積電阻,為了減小接觸電阻對測試的影響,採用銀導電膠將銅片粘接在試樣的兩個端面上,靜置24小時,待銀導電膠凝固,試謝長瓊:熱拉仲對pet / pe / cb復合導電體系形態和性能的影響樣的電阻穩定后再測量。
  13. The scanning electron microscope provides information on chemical composition by use of x-ray spectrometer attachments.

    掃描電子顯微鏡能利用x射線譜儀的附件來提供化學組份的信息。
  14. Imaging signals used in scanning electron microscope

    掃描電子顯微鏡成像信號分析
  15. Verification regulation of scanning electron microscope

    掃描電子顯微鏡試行檢定規程
  16. In chapter two, we fabricated r - ni - fe / al2o3 nanocomposites successfully by using ball - milling mixing method plus hot - pressing process. meanwhile, their microstructures are characterized by x - ray diffraction ( xrd ) analyser, transmission electron microscopy ( tem ), field emission scanning electron microscopy ( fe - sem ) and brunauer - emmett - teller ( bet ). the results indicate that ni - fe particles are homogenously dispersed in the matrix in the composites

    在第二章中,我們採用高能球磨混合方法加上熱壓燒結工藝,成功制備了ni - 20fe al _ 2o _ 3納米復合材料,並通過x射線衍射儀( xrd ) 、透射電鏡( tem ) 、場發射掃描電鏡( fe - sem ) 、比表面孔隙儀( bet )對該復合材料的微結構進行了表徵。
  17. The tensile strength and young ’ s modulus of cf / ep specimens before and after vacuum thermo - cycling were measured by an electrical universal material testing machine. an electron scanning microscope was used to perform the surface morphology and fractography of specimens

    真空熱循環試驗前後cf / ep層合材料的拉伸性能由電子萬能材料試驗機完成,本文利用掃描電鏡觀測試樣表面形貌和拉伸后的斷口形貌。
  18. Acoustical holography by electron - beam scanning

    電子束掃描聲全息
  19. Observation of morphology of third - instar warble in yak by scanning electron microscopy

    應用掃描電子顯微鏡對氂牛皮蠅三期幼蟲的形態學觀察
  20. Electron scanning micrograph

    電子掃描顯微照片
分享友人