generation lifetime 中文意思是什麼

generation lifetime 解釋
發生濤命生成壽命
  • generation : n. 1. 代〈約30年〉，世代，時代；同時代的人。2. 一代[一世]。3. 生殖，生育；發生，產生。4. 【數學】（面、體、線的）形成。5. 完善化階段，完善化方案，完善化的模型；發展階段。
  • lifetime : 1. 一生，終生。2. 【原子能】壽命。
  1. Second, there appears to be ample uranium at reasonable cost to sustain the tripling in global nuclear power generation that we envisage with a once - through fuel cycle for the entire lifetime of the nuclear fleet ( about 40 to 50 years for each plant )

    其次，地球上似乎還有充份的鈾，能以合理的價格去維持未來全球核能電廠的營運這里所設想的情況是，這些電廠數目在未來將增加兩倍，而且在其整個壽命（每個電廠約40 ~ 50年）中都是使用單次燃料循環。
  2. The new requirements for applications in material surface engineering urge a new type of hipib apparatus, for instance, the generation of medium - power - density ion beam, high - stability ion beams and long - lifetime ion source etc. therefore, characterization of high power ion diode - magnetically insulated ion diode ( mid ), the key issue for the technique development, is considered in this dissertation. the investigations of hipib generation and its mechanisms have been carried out in a temp - 6 hipib apparatus, in order to optimize the configuration of ion diode and its ion beam parameters for materials surface treatments

    針對強流脈沖離子束（ hipib ）技術研發的關鍵環節?高功率離子二極體（磁絕緣離子二極體）的工作特性，在temp - 6型hipib裝置上開展了hipib產生及其形成機理的實驗研究，確定了優化的離子二極體結構和輻照工藝參數；通過hipib輻照金屬材料燒蝕行為的系統研究，揭示了燒蝕表面形貌的形成規律，為徹底弄清hipib與材料相互作用機理提供了實驗依據。
  3. The object lifetime view lists total instances of each type and a generation bucket that lists the number of generations that an instance of a type lived

    對象生存期視圖列出每種類型的實例總數，以及用於列出活動類型的實例的代數目的代存儲桶。
  4. Study on the computer - aided measurement of minority carrier generation lifetime and its application

    少子產生壽命計算機輔助測量及應用的研究
  5. Abstract : the saturation behavior of stress current is studied. the three types of precursor sites for trap generation are also introduced by fitting method based on first order rate equation. a further investigation by statistics experiments shows that there are definite relationships among time constant of trap generation, the time - to - breakdown, and stress voltage. it also means that the time constant of trap generation can be used to predict oxide lifetime. this method is faster for tddb study compared with usual breakdown experiments

    文摘:基於一階速率方程，討論了恆定電壓應力下應力電流的飽和行為.通過對應力電流的擬合，發現存在三類缺陷產生的前身.更進一步的統計實驗顯示，在缺陷產生時間常數、擊穿時間以及應力電壓之間存在著明確的關系.這意味著缺陷產生時間常數能夠被用於有效預測氧化層的壽命.與常規的氧化層擊穿實驗相比，基於缺陷產生時間常數的預測更快、更有效
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