x-ray photoelectron spectroscopy 中文意思是什麼

x-ray photoelectron spectroscopy 解釋
x射線光電子光譜學
  • x : X2＝ （羅馬數字）10 XX ＝ 20 IX ＝ 9 XV ＝ 15 XL ＝ 40 LX ＝ 60 XC ＝ 90 DXL ＝ 540 MX ＝ 1010 ＝...
  • ray : n 雷〈姓氏，男子名， Raymond 的昵稱〉。n 1 光線，射線，熱線；〈詩〉光輝，閃爍，曙光，一線光明。2 ...
  • photoelectron : n. 【物、化】光電子。
  • spectroscopy : n. 【物理學】分光術，光譜學。n. -ist
  1. Chiral quaternary ammonium salts were synthesized from cinchonine in cinchona alkaloids using chloromethylated polystyrene - polyethylene glycol, diethylene glycol, triethylene glycol and glycol as polymer - supported phase transfer catalysts, finsl products were characterized by ftir, elemental analysis, scanning electron microscopy, x - ray photoelectron spectroscopy ( xps )

    摘要以金雞納生物堿中的辛可寧為原料，氯甲基化聚苯乙烯聚乙二醇、一縮二乙二醇、二縮三乙二醇、乙二醇等為載體合成了幾種聚合物負載的手性季銨鹽，並對它們的結構用紅外光譜、元素分析、掃描電鏡和x射線光電子能譜等測試手段進行了表徵。
  2. X - ray photoelectron spectroscopy studies of archeological bronzes

    青銅文物光電子能譜分析
  3. Surface states and the topmost surface atoms of the batio3 thin films have been analyzed by x - ray photoelectron spectroscopy ( xps ) and angle - resolved x - ray photoelectron spectroscopy ( arxps ). the results show that the as - grown batio3 thin films have an enriched - bao nonstoichiometric surface layer which can be removed by ar + ion sputtering, and the atomic ratio of ba to ti decreases with increasing the depth of ar + ion sputtering

    用x射線光電子能譜技術（ xps ）和角分辨x射線光電子能譜技術（ arxps ）研究了薄膜的表面化學態以及最頂層原子種類和分佈狀況，結果顯示在熱處理過程中薄膜表面形成一層富含bao的非計量鈦氧化物層，並且鋇-鈦原子濃度比隨著探測深度的增大而逐漸減小。
  4. Scanning electron microscope ( sem ) and x - ray photoelectron spectroscopy ( xps ) studies indicated that the additive of cs _ 2 took part in the sei film - forming in the process of battery cycles. the elements of carbon, oxygen and fluorin are the main members in the compounds of sei film. sulfur is also one of the main elements of the sei film when the electrolyte included additive of cs _ 2

    利用掃描電子顯微鏡和x射線光電子能譜研究表明，二硫化碳在電池的循環過程中參與了sei膜的形成， sei膜的組成物質中主要是c 、 o 、 f三種元素，加入二硫化碳后， s元素也成為主要組分， sei膜的主要組成物質有烷基氧鋰、烷基碳酸酯鋰、碳酸鋰、硫酸鹽、聚烯烴及氟化鋰等。
  5. Gas permeability tester and mechanical folding device were developed to study the barrier property and deformation failure behaviors. the surface characterization, chemical structure, optical, mechanical properties of pet coated with dlc have been investigated by x - ray photoelectron spectroscopy ( xps ), contact angle measurement, light transmission analysis, nanoindentation and friction wear tests

    通過x射線光電子譜分析、接觸角測定、光學透過率分析、納米壓痕、摩擦磨損試驗、機械彎折試驗、氣體透過率試驗，對膜層的表面特徵，光學、力學及氣體阻隔性能進行了系統的研究。
  6. The thermal stability of high - k thin film deposited on si substrate has been studied using x - ray photoelectron spectroscopy ( xps )

    通過x射線光電子能譜對沉積在si基底上的high - k薄膜的熱穩定性進行了研究。
  7. By film thickness measured, fourier transformed infrared spectrometer ( ftir ) analysis, x - ray photoelectron spectroscopy ( xps ) analysis and relative irradiance measurement, the effect of microwave input powers on deposition rates, f / c ratios, bonding configurations of ct - c : f films and the radicals in plasma originating from source gases dissociation is analyzed

    由於微波功率的改變會導致等離子體中電子溫度和等離子體密度發生變化，從而造成不同的源氣體分解過程，結果微波功率的升高導致了薄膜沉積速率的提高、 f / c比的降低，同時也導致薄膜中cf和cf _ 3基團密度的降低，而保持cf _ 2基團密度接近常數。
  8. The mechanical modifying equipment was used to prepare compounded micro - spheres from pmma particles and ps particles with metal particles and tio2 nano - particles. the sem was used to observe the images of particles and x - ray photoelectron spectroscopy ( xps ) is used to obtain surface spectrum. herein the tio2 nano - particles can be dispersed on larger polymer particles and their surface morphology is different by using different polymer particles

    使用掃描電鏡和光電子能譜對制得的復合微粒子進行表徵，發現該方法可以使納米tio _ 2粒子呈很好的分散狀態復合在聚合物微球及金屬粒子上，而且隨著聚合物微球原料的不同，納米tio _ 2粒子能在高聚物的表面的復合狀態也不同。
  9. Effects of oxygen pressure on microstructure of lno conductive thin film has been studied by in situ reflection high energy diffraction ( rheed ) and ex situ x - ray photoelectron spectroscopy ( xps ). in the relatively low oxygen pressure, lno film displays spotty rheed pattern

    首先，通過原位高能電子衍射（ rheed ）及x光電子能譜（ xps ）研究了氧分壓對lno導電薄膜微結構的影響，並進一步提出了氧分壓對lno薄膜微結構的影響的機理。
  10. Secondly, the grafted membranes were prepared by grafting 2 - acrylamido - 2 - methyl propane sulfonic acid ( amps ) on pretreated membranes using cetric ammonium nitrate ( can ) as an initiator in the aqueous medium. the surface compositions of the grafted membranes were determined by fourier transform adsorption spectrum ( ftir ) and x - ray photoelectron spectroscopy ( xps ). and the morphology of the grafted membranes was studied by scanning electron microscopy ( sem ) and atomic force microscopy ( afm )

    然後，選用硝酸鈰銨作為引發劑， 2 -丙烯酰胺- 2 -甲基丙磺酸（ amps ）為接枝單體，在水溶液體系中進行接枝共聚反應制備pvdf ? g ? amps中空纖維膜，並利用傅立葉紅外光譜（ ftir ） 、 x光電子能譜（ xps ） 、掃描電子顯微鏡（ sem ）及原子力顯微鏡（ afm ）等檢測手段證實了接枝共聚物的存在。
  11. The chief results and conclusion thus arrived at are as folloes : ( 1 ) the morphology and electrical properties of indium - tin - oxide ( ito ) films which were treated respectively by ethanol, naoh, sulfuric and oxygen plasma, were studied from microscopic view by atomic force microscopy, x - ray photoelectron spectroscopy and goniometer

    （ 1 ）利用原子力顯微鏡、接觸角測試儀、紫外分光光度計從微觀角度研究了乙醇、氫氧化鈉、濃硫酸、氧等離子體處理對ito薄膜的表面性能和光電性能的影響。
  12. Current researches, applications, preparation and structure of si3n4 are summarized in this paper. a new conclusion is drawn that silicon wafer can react with nitrogen at the temperature higher than 1100 and in super - pure nitrogen by direct - nitridation of silicon at the temperature from 800 to 1200. the prepared silicon nitride samples are tested by xps ( x - ray photoelectron spectroscopy ), sem ( scanning electron microscopy ), optical microscopy, xrd ( x - ray diffraction ) and edx ( energy dispersive x - ray analysis )

    通過矽片在800到1200各個溫度和各種氮氣氣氛下的氮化處理的實驗結果，報道了不同與其他研究者的氮化條件，矽片在氮氣保護的熱處理中的氮化條件為：高於1100的溫度和高純氮的氣氛條件，同時對該氮化硅薄膜進行了金相顯微鏡、掃描電鏡（ sem ） 、 x射線衍射儀（ xrd ） 、 x射線光電子譜（ xps ） 、 x射線能譜儀（ edx ）和抗氧化性等測試和分析。
  13. The phases structure of the kapton film and protective film were determined by x - ray diffraction ( xrd ) and x - ray photoelectron spectroscopy ( xps )

    用x射線衍射分析（ xrd ） 、光電子能譜（ xps ）對基體薄膜及鍍膜的物相成分、化學結構進行表徵。
  14. The results of attenuated total reflectance - fourier transform infrared ( atr - ftir ), x - ray photoelectron spectroscopy ( xps ) and contact angle measurement showed that the amphiphilic copolymer could self - segregate on the hydrophobic pdl - la surface

    利用衰減全反射傅立葉轉換紅外光譜（ atr - ftir ） 、 x -射線光電子能譜（ xps ）分析以及接觸角測定對改性聚乳酸材料表面進行了表徵。
  15. The infrared spectroscopy, transmission electron microscopy, light scattering and x - ray photoelectron spectroscopy are used to characterize the polymer structure and the morphology of the latex particles. the results demonstrate that composite latex with core / shell morphology is indeed successfully prepared

    利用紅外光譜、透射電鏡、激光粒度儀、表面能譜分析等手段對聚合產物的化學結構及乳膠粒粒子形態進行了表徵。
  16. X ray photoelectron spectroscopy x

    射線光電子能譜學
  17. The performance of hydraulic transmission fluid no. 8, hyper automatic transmission fluid ( atf ), continuously variable transmission fluid ( cvtf ) were compared. the compared results are the reference of chosing the right fluid in cvt. the mechanism of znddp additive how effects on the performance of cvtf is investigated by x - ray photoelectron spectroscopy ( xps )

    （ 4 ）研究了cvt對油品的品質需求，並進行了8號液力傳動油、 atf油和cvtf油的理化指標和摩擦性能對比測試，實驗結果為cvt變速器油的選用提供了參考；用x -射線光電子能譜儀對znddp添加劑的作用機理進行了研究，通過四球磨斑實驗，驗證了znddp添加劑對自動變速器油的改性作用，為國內cvtf的研製指明了方向。
  18. The resulting antimony doped tin dioxide thin film has good optical and electrical properties. the mechanism of the film formation in spray pyrolysis method was also discussed. the films were characterized by x - ray diffraction, scanning electron microscopy, atomic force microscopy, ultraviolet and visible transmittance spectroscopy x - ray photoelectron spectroscopy and so on

    在經過深入的文獻查閱和前期研究工作基礎上，本文提出以無機金屬鹽sncl _ 2 ? 2h _ 2o和sbcl _ 3為原料，採用噴霧熱分解法制備得到光學、電學性能優良的摻sb的sno _ 2薄膜，並深入探討了噴霧熱分解法的成膜機理。
  19. The substrates were biased by dc voltage negatively with respect to ground. the films were characterized by infrared spectra and x - ray photoelectron spectroscopy ( xps )

    薄膜成分以紅外吸收譜和x射線光電子能譜標識，薄膜形貌以原子力顯微鏡觀測。
  20. The structure properties of a - sinx : h are characterized and analyzed by using ellipsometry, fourier transform infrared ( ftir ) spectroscopy and x - ray photoelectron spectroscopy ( xps ), all the results suggest that the films with the structure of silicon dots / clusters embedding in silicon nitride matrix can be obtained by controlling the hwp - cvd conditions properly

    利用橢偏儀，傅立葉紅外吸收譜（ ftir ） ， x射線光電子能譜（ xps ）等技術對a - sin _ x ： h的結構特性進行了表徵與分析，結果表明，採用hwp - cvd技術合理控制實驗條件，可得到鑲嵌在sin _ x中的納米si結構薄膜。
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