xrf 中文意思是什麼

xrf 解釋
x線熒光光譜學
  1. Determination of cl br and i in bittern by xrf

    射線熒光光譜法測定東營地區鹵水中的氯溴碘
  2. The xrf analysis of plct thin films shows that the atomic ratio of plct thin films is closed the ideal chemical mole ratio of plct thin films

    利用xrf分析了plct薄膜的pb 、 la 、 ca 、 ti原子百分比，可以看出其比例接近於設計的化學式摩爾比。
  3. It is used in solar cells and semiconductor detectors for astrophysical research, for x - ray fluorescence ( xrf ) analysis, industrial gauging, nuclear proliferation treaty verifaction et. al, and also in laser window and infrared array technology as subtriate for hg1 - xcdxte

    同時它還可作為紅外探測器材料碲鎘汞（ hgcdte ）和外延襯底，以及激光窗口和太陽電池等。
  4. Because the concentration of zirconium in uranium has large ranges, from 1. 50xlo ' 6 - 3. 8g / gu, not only how to decrease the remainder of uranium to eliminate its determinate effect but also how to acquire higher recovery of zirconium is considered, so the method of silica gel, the method of tbp levextrel resin chromatography, the method of tta chromatography and the method of tta extraction are compared. then tta extraction is chosen to acquire the ideal separation purpose. compared with icp - ms and icp - aes, xrf has characters of high repeatability, stability, low cost, high concentration elements analysis, the ability to determinate solid sample and having comprehensive practicability, but xrf has lower sensitivity, so how to increase the concentration of the sample to acquire better precision is a difficult problem, the optimum of operating condition : the integral time of spectral lines is 60s, the integral time of background lines is 20s, the voltage of xrf is 50kv, the electric current is 50ma

    由於鈾中鋯的含量范圍很廣，從1 . 50 10 ~ （ - 6 ） 3 . 8g / gu ，在分離和測量時，既要考慮盡量地減少鈾的殘留量以消除鈾對鋯測量產生的影響，又要獲得鋯的理想的回收率，因此本文在分離方法的選擇上比較了硅膠吸附分離法， cl - tbp萃取色層法， tta萃取色層法和tta萃取分離法的優缺點，認為tta萃取分離法可以達到理想的分離效果。
  5. Polarized microscopy, sem - eds, xrf, uv - vis, pl, ftir, epr have been used in this study to investigate two chameleon diamonds and a synthetic diamond which show color - change effects

    摘要對具有變色效應的兩顆變色龍金剛石與一顆鮮黃色合成金剛石進行了掃描電鏡能譜、 x射線熒光光譜、顯微紅外光譜、紫外可見吸收光譜、光致發光譜、電子順磁共振譜等測試研究，以探討引起金剛石變色的原因。
  6. According to these, a set of convenience and simple xrf geological mapping techniques were set up. the xrf technique has been first used in luhuo au mine field, sichuan province and tongliang sr mine field

    在理論研究的基礎上，採用x射線熒光現場測量技術對四川爐霍縣某金礦勘查區和重慶某鍶礦勘查區等地進行了地質填圖試驗。
  7. Chemical analysis of refractory products by xrf - fused cast bead method iso 12677 : 2003 ; german version en iso 12677 : 2003

    用xrf法對耐火產品進行化學分析.熔鑄法
  8. Determination of 8 elements in blast - furnace slag and electric - frunace slag by xrf

    射線熒光光譜法測定高爐渣和電爐渣中8種常見元素
  9. The phase structure of different cu - fe thin films were studied by using grazing incidence x - ray analysis ( gixa ). the texture and residual stress of different cu - fe thin films were measured by scan of x - ray diffraction ( xrd ) and 2 scan with different. the thicknesses of different thin films were characterized by means of small angle x - ray scattering ( saxs ) technique. by using atomic force microscope ( afm ) measured surface roughness of thin films. the component of different thin film was characterized by energy disperse spectrum ( eds ) and x - ray fluorescence ( xrf ). the magnetic properties of cu - fe thin films were measured by means of vibrating sample magnetometer ( vsm ). in addition, the giant magnetoresistance ( gmr ) effects of different films were also measured. the original resistance of the film fabricated by a direction - current magnetron sputtering system is directly affected by bias voltage

    利用掠入射x射線分析（ gixa ）技術對不同cu - fe薄膜的相結構進行了研究;利用xrd掃描及不同角度的2掃描對薄膜進行了結晶織構及殘余應力分析;運用小角x射線散射（ saxs ）技術測量了薄膜的厚度;採用原子力顯微鏡（ afm ）觀察了薄膜的表面形貌;運用能量損失譜（ eds ）及x射線熒光光譜（ xrf ）對薄膜進行了成分標定;使用振動樣品磁強計測量了不同cu - fe過飽和固溶體薄膜的磁性能;最後利用自製的磁阻性能測試設備測量了真空磁場熱處理前後不同薄膜的巨磁阻值。
  10. Introducing xrf analyzer, which can analyse quantitatively the content of each element in the clay quickly

    採用xrf法能夠快速地對高嶺土中各元素進行定量分析。
  11. With the combination of xrf and xrd, we studied the rule of component, structure, crystal grain feature of chromium deposited coating. the law of trivalent chromium electrodepositing were extracted and contrasted with that of hexavalent chromium, laying a foundation stone for the deeper research on the process of trivalent chromium electrodeposition and it ' s industrialization

    並結合xrf 、 xrd等研究手段，對不同工藝條件下所得鍍層的成份、結構、品粒特徵規律進行研究，提出了三價鉻鍍鉻的電鍍機理，為深入研究三價鉻鍍鉻工藝及工業化應用奠定了基礎。
  12. Morphology of b - doped diamond had been observed by sem. boron contents and impurity situation of b - doped diamond had been analyzed by ftir / raman and xrf

    對含硼金剛石在sem下進行形貌觀察，通過紅外拉曼光譜、 x射線熒光（ xrf ）分析硼摻雜的存在狀態和含量。
  13. By means of a1c13 hydrolyzing in naoh solution, the author prepared al - plms which were characterized by xrd, xrf, ft - ir, sem etc. some factors in the experiments were studied in detail. the result showed that the concentration of a1c13, naoh, al - pillaring solution did n ' t affect the basal spacing and thermal stability of al - plms greatly

    筆者採用alcl _ 3在naoh溶液中水解的方法制備了鋁柱撐蒙脫石，並利用xrd 、 xrf 、 ft - ir 、 sem 、 n _ 2吸附?脫附等手段對制得的樣品進行了表徵，系統討論了各實驗因素的影響。
  14. Xrf online analytical system for concentrate grade and moisture

    精礦品位及水分在線分析系統
  15. The main sources of the measurement uncertainty by xrf are analysed and some factors impacting on the uncertainty are discussed, which is good for developing the measurement uncertainty in the actual work

    著重分析了採用x射線熒光能譜法測定貴金屬含量時測量結果不確定度的主要來源，並探討了幾種因素對不確定度的影響，有利於在實際檢測中對其進行合理的評定工作。
  16. The recovery can reach 95 % after it extracts once, rsd % is lower than 10 %, the detection limit of zirconium is 1. 3u. g / ml. and increasing the application of film in xrf is studied. the method of using organic sample to make resource after extracted by tta can be used to determine zirconium in simulated p rocess solution of spent fuel reprocessing quickly and veraciouly

    萃取一次便可達到理想的萃取效果，回收率可達95 ，相對標準偏差10 ，鋯的檢出限為1 . 30 g / ml ，同時改進了薄膜法在x射線熒光光譜法中的應用范圍，此方法採用tta萃取分離的有機相直接制源可快速、準確地對測定purex模擬工藝料液中的鋯含量。
  17. 8 instrument grounding to be establish at suitable side of laboratory building. some special instrument, such as xrf, aas, and icp, should be grounding design within 0. 5

    在實驗室建築合適的位置設立儀器接地裝置，某些儀器xrf 、 aas 、 icp等需要有接地，接地電阻小於0 . 5 。
  18. A review with 31 references is given on the harm of lead in the body, the shortage of blood lead leve, the importance of bone lead and the progress of xrf

    摘要綜述了人體鉛含量的危害，血鉛檢測的局限性以及骨鉛檢測的必要性和檢測技術研究進展。
  19. Xrf x - ray fluorescence spectroscopy of pigments and extenders

    顏料和填充劑的x射線螢光
  20. The application of portable multi - element xrf analyzer to geological survey

    熒光儀在地質普查中的應用
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