檢偏鏡 的英文怎麼說

中文拼音 [jiǎnpiānjìng]
檢偏鏡 英文
analyser
  • 檢 : Ⅰ動詞1 （查） check up; inspect; examine 2 （約束; 檢點） restrain oneself; be careful in one s c...
  • 偏 : Ⅰ形容詞1 （不正; 歪斜） inclined to one side; slanting; leaning 2 （只側重一面） partial; prejudi...
  • 鏡 : Ⅰ名詞1 （鏡子） looking glass; mirror 2 （幫助視力或做光學實驗的器具） lens; glass 3 （姓氏） a s...
  1. The light transmitted by the analyzer will therefore predominate in red, and will have a pinkish hue.

    因此由檢偏振鏡透射出來的光將以紅光為主，並有粉紅色。
  2. Minute hardness testing systems, hardness meters vickers, rockwell, shore, metalloscopes, magnetic detectors, demagnetizers, metallographic inspection devices, surface roughness meters, electrical micrometers, air micrometers, mu meters, electrical converters, bore micrometers, cylindrical gauges, block gauges, eccentricity meters, precision bases, others

    微小硬度系統硬度計維克斯洛氏邵氏金屬顯微鏡磁力探測機脫磁機金屬組織檢查裝置表面粗糙測定器電微型壓力機空氣微型壓力機微米表電轉換器鏜孔微型壓力機缸徑規塊規偏芯測定器精密加工臺等等。
  3. There are many methods to investigate domains, such as polarization microscopy, scanning electron microscopy, transmission electron microscopy, scanning electron acoustic microscopy and so on. however, these methods suffer from some serious disadvantages involving complex sample preparation, damage to sample, low resolution

    現有的鐵電疇檢測手段，如偏光顯微鏡、粉末花樣技術、掃描電鏡、透射電鏡、掃描電子聲顯微鏡等存在這樣或那樣的缺點：諸如制樣繁瑣、易破壞原始疇結構、或疇結構成像解析度還不夠高等。
  4. In this dissertation, we studied the tcra1101plus total station position system, which introduced the principle and characters of the instrument ' s closed loop tracking system. also we explained the cause of prism ' s position error and brought forward mathematic model to correct, moreover, the good results has been drawn form the expenriments. the kinetic survey system have been realized, which the sampling rate attain more than 5hz and the position precision can be less than 2mm on condition that targeted - point moving slowly at the velocity below 2cm / s. having finished the survey system to examine whether the fine - tuning stewart platform in good status, we have finished mensurating the position reference of the fine - tuning stewart platform and the offset of the prism

    在此基礎上研製了多臺儀器在線控制高頻采樣動態跟蹤測量系統，采樣率大於5hz ，在跟蹤小於2cm / s低速運動目標時，測量精度好於2mm ；完成對饋源二次精調系統的檢測，包括對二次精調平臺位置基準的標定和觀測棱鏡偏心差的測定；設計不同動態測量實驗，對全站儀動態跟蹤的誤差來源和特點進行了分析；從實驗角度，對全站儀的測量時滯及其穩定性進行了測試分析，給出了定量的結果；比較了全站儀和計算機的內部時間系統，發現兩者存在較大差異。
  5. These colors will change into the complementary values when the analyzer is rotated through 90°.

    當檢偏振鏡轉過90時，這些顏色就會變為它們各自的互補色。
  6. < uk > these colors will change into the complementary values when the analyzer is rotated through 90. < / uk >

    < uk >當檢偏振鏡轉過90時，這些顏色就會變為它們各自的互補色。 < / uk >
  7. But for some special medium materials, such as liquid crystal display controller pcb, magnifiers must be used to gather images to gain enough precision of inspection for the weak contrast between the basic board and the conductor. the images near the light axes are much cleared than that far away from the light axes, so the images can not be simply segmented by black and white and inspected with the methods of pcb which are based on the black white image

    但對於一些特殊介質材料，如液晶顯示控制電路板的檢測，由於基板和導體之間對比度不大，而且為了達到檢測精度，必須採用放大鏡頭進行圖像採集，成像系統光軸附近的圖像成像質量較好，而偏離光軸較遠的圖像質量較差。不能通過簡單二值化來很好地分割圖像，而已有的印刷電路板檢測方法都是建立在二值圖像進行分析的基礎上。
  8. In this thesis, scanning force microscopy ( sfm ) was used to study the nanoscale electric phenomena of the surface and interface properties of ferroelectric thin films. the experimental setup was calibrated by measuring potential distribution of the working resistance of integrated chip

    在實驗儀器的驗證方面，選用集成電路晶元測試單元中的埋置條形電阻作為檢測對象，在電阻兩端外加直流偏壓后檢測電阻的電勢分佈，在已知電阻上電勢分佈的前提下，驗證了開爾文力顯微鏡檢測微區表面電勢的可靠性。
  9. According to the principle of correlation detection, an automatic measurement system for extinction ratio of polarizer consisted of monochromator and dsp lock - in amplifier and compurer is designed not only to eliminate the influence on measurement accuracy caused by drift of intensity of light source but also to obatain approximate extinction spectrum

    摘要基於相干檢測原理設計了一套由單色儀、數字鎖相放大器和計算機聯合使用的透射式偏光鏡消光比智能化測試實驗系統，採用雙頻雙光路分光單探測器接收鎖相放大器分離信號比對法進行源補償測量，克服了光源光強漂移所帶來的影響；實現了可見光區消光比的精確自動測量，而且可以測得近似的消光光譜。
  10. In chapter 5, the key algorithms of the computer vision 3 - d micro inspection system are studied. the algorithms of system calibration, image matching and correction of lens aberrance in system calibration are introduced in detail. in chapter 6, the 3 - d micro - inspection system based on computer vision is developed according to the design scheme

    第五章對視覺三維微檢測系統的關鍵演算法作了深入研究，提出並詳細闡述了系統的定標、圖像匹配以及定標中透鏡畸變的糾偏演算法，第六章根據視覺微檢測系統設計方案實現了視覺三維微檢測系統，並進行了微構件的測量實驗和誤差分析工作。
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