薄片厚度 的英文怎麼說

中文拼音 [bópiānhòudù]
薄片厚度 英文
blechdicke gage / gage thickness
  • 薄 : 名詞[方言] （浮萍） duckweed
  • 片 : 片構詞成分。
  • 度 : 度動詞[書面語] （推測; 估計） surmise; estimate
  • 薄片 : slice; thin slice; thinsection; scaleboard; microsection; sheet; lamina; wafer; flake; lepid ; le...
  1. Tensile test without extensometer on foils and strips of aluminium and wrought aluminium alloys with a thickness up to 0, 179 mm

    對厚度在0 . 179mm以下的鋁和鍛造鋁合金薄片材和帶材進
  2. The iron doped tio2 thin films showed almost no photocatalytic activity for the photodegradation of no in the gaseous phase when the calcination temperature was lower than 400 c. this was due to the fact that the phase structure of the film was amorphous. at 400 c, the film appeared obviously photoactive du

    對于用液相沉積法所制備的tio :薄膜，薄膜中的si （或fe ）含量和薄膜的厚度可通過調節前驅體濃度、溶液的ph值、基片的沉積溫度和沉積時間，薄膜的熱處理溫度和時間進行有效地控制。
  3. Sol - gel method was used for preparing the nano - tio2 photocatalytic film on general glas slid and ito conductive glass. the spectrum property, surface image, crystlal type, particle size, thickness and other properties of this film were measured by uv - vis, afm, xrd and other apparatus

    採用溶膠-凝膠法在普通玻璃載波片和ito導電玻璃上制備出負載型納米tio _ 2薄膜，並用uv - vis ， afm ， xrd等對納米tio _ 2薄膜的光譜特性、表面形貌、晶型及粒子大小、薄膜厚度等進行了表徵。
  4. Controlling temperature using scr system, the range of temperature difference controlling one centigrade, precisely controlling the thickness of sheet and flatness for the plasticizing process. adjusting the interspace of screw and pressing roll to adjust the sheet thickness, can control precisely the thickness. can select the grain roller from

    ，對塑化過程及板片厚薄平整度均能作到精確控制板片厚薄採用機筒螺桿與壓輥雙向調整，可精確控制其厚薄壓花輥從
  5. The transmittance and reflectance spectra of bn films were obtained as a function of incident photon wavelengths, and the thickness of films was measured by alpha - step meter

    用紫外-可見分光光度計測量了沉積在石英片上的bn薄膜的透射光譜和反射光譜，用臺階儀測量薄膜的厚度。
  6. Either the boron nitride ( bn ) thin films with different cubic phase content were deposited on n - type si ( 111 ) and fused silica substrates by radio frequency ( rf ) sputtering using two - stage deposition process. the films were characterized by fourier transform infrared ( ftir ) spectroscopy. the transmittance te ( ) and reflectance re ( ) were obtained as a function of incident photo wavelengths and the thickness of films was measured by alpha - step. the absorption coefficient was calculated from te ( ) and re ( ). the optical band gap ( eg ) of the films was determined by effective medium form of formula containing eg

    本文還研究了立方相含量與光學帶隙的關系，在n型si （ 111 ）片和熔融石英片上沉積出不同體積分數的立方氮化硼薄膜，薄膜的成分由傅立葉紅外吸收譜標識；用紫外-可見分光光度計測量了沉積在石英片上的bn薄膜的透射光譜te （ ）和反射光譜re （ ） ，薄膜的厚度用臺階儀測得。
  7. A representative slice of unit thickness in then taken for analysis purposes.

    取代有代表性的單位厚度的薄片作為分析對象。
  8. El lamp can be applied to motor vehicle as indication panel, third brake - light, emergency light, indicating sign, company logo and advertisement also

    冷光片的厚度纖薄，適合應用在汽車內的廣告標示指示標志第三煞車燈和儀表面板上，提供清晰而悅目的指引。
  9. Plastics - film and sheeting - determination of thickness

    塑料.薄膜和片材.厚度測定
  10. Based on the requirement of the device, we grow the films of silicon of high quality. the thickness of the epilayer is from 0. 4 u m tol p m, the doping concentration can be controlled conveniently

    然後，根據器件的要求，利用uhv cvd技術，生長出優質薄硅外延片，其厚度在0 . 4 m 1 m ，摻雜濃度可任意調節，晶體質量良好。
  11. On the design of the system, the thickness measure system of mems chip is built based on lbu and pump - probe technology. on the analysis of data, the reflectivity curve is analyzed using the law of reflectivity change induced by ultrasound, and the thickness is calculated using the system designed by the article, to aluminum film the size of about 20nm can be measured, when the film be measured is single layer, the relative error of the system is less than 2 %, when the film be measured is double layer, the relative error of the system is less than 10 %

    在基礎理論方面研究了激光（特別是超短脈沖激光）超聲的激勵機理，探討了激光調制技術以提高系統信噪比，闡述了泵束探針束技術及相關實驗設置；在系統設計上，以激光超聲為基本原理，以泵束探針束技術為系統設計方案完成了mems基片厚度測量系統的設計；在數據分析方法上，利用聲致光反射率變化的一般規律對測得的光反射率曲線進行分析，確定超聲回波在薄膜兩界面間來回傳播的時間，以計算薄膜的厚度。
  12. In order to - obtain the required thickness a number of sheets of pieces of cloth were glued together

    為了達到必要的厚度，需要用膠水把數片薄布粘合起來。
  13. Based on the characterization results, the as - prepared graphite nanosheets were found to be roughly circular platelets of about 50 nm in thickness and 12 urn in diameter, exhibiting a mean aspect ratio in the range of 150 - 300

    基於多種表徵技術，測試結果表明所制得的納米石墨近似於厚度在50nm左右，直徑約為12 m的圓形薄片。該結構對納米石墨薄片在聚合物基體中形成導電網路極為有利。
  14. For the flexible support reed is very thin ( 1. 3mm ), it ' s necessary to study the buckle of the primary mirror assembly. the calculation indicates that when space camera is launched, the primary mirror assembly would work well

    為了滿足主鏡的設計約束條件，主鏡柔性支撐簧片厚度設計的較薄（ 1 . 3mm ） ，因此有必要對主鏡組件的結構穩定性進行校核。
  15. The equation is y = a ebx, the interrelated coefficients are all larger than 0. 95 ; when the rainfalls are close, the volume of the surface runoff increases with the intensity of rainfall and the volume of the surface runoff is remarkable related with the maximum rain intensities of 30 minutes ; with the effect on rain harvesting acreage, the cover rate of the plants, the gradient, and the average soil thickness, the cover rate of the plants and the average soil thickness are the important factors which can affect the volume of rain harvesting. and the average soil thickness is the dominant factor. in order to get good result, we must choice the slope which the cover rate of the plants is low and the average soil thickness is thin, meanwhile increase the rain - harvesting acreage

    太行山片麻巖區坡面集雨規律及集雨技術：集雨量與降雨量呈顯著正相關，並且在降雨量大於17 . 6mm時，集雨量隨降雨量的增加呈指數形式增加，擬合方程為y = ae ~ （ bx ） ，相關系數均大於0 . 95 ；降雨量相近的條件下，徑流量隨降雨強度的增大而增大，且在片麻巖山地， 30min最大雨強是影響產流的關鍵因子；在集雨面積、植被覆蓋度、坡度以及平均土層厚度等因素的共同影響下，植被覆蓋度和平均土層厚度是影響集雨量多少的主要因素，其中平均土層厚度是主導因素；而要想取得良好的集雨效果，必須在選擇植被覆蓋度低、坡面土層厚度薄的坡面的同時，加大集雨面積。
  16. ( 4 ) the study of the optical band gap of cnx film by uv - vis spectrophotometer. ( 5 ) by using the microhardness tester, we study the hardness of cnx film on the ceremic substrate by dc magnetron reactive sputtering with the feed ar and n2 flow rate, film thickness, substrate temperature and substrate bias

    （ 5 ）用直流磁控反應濺射法，以陶瓷作為襯底，對在ar和n2不同流量、不同膜厚、不同基片溫度和對基片施加不同偏壓下沉積的薄膜，用< wp = 4 >顯微硬度計研究測試了不同工藝參數下的相應硬度。
  17. Samples are prepared at 1100 and 1200 for different time from 5 minutes to 4 hours to study direct - nitridation kinetics. the thickness of the silicon nitride films is measured by single - spot thickness system produced by filmetrics co. ltd. the direct - nitridation kinetics curve is attained and the maximum thickness of the silicon nitride film is about 50nm

    為研究矽片氮化動力學，在1100和1200的溫度下制備了從5分鐘到4小時的各個氮化時間的樣品，並採用了不同晶面取向的矽片和不同的矽片放置位置，用filmetrics公司生產的f20型膜厚測量儀測得各個樣品的厚度，得到了實際的氮化動力學曲線和氮化薄膜的最終膜厚約為50納米，氮氣曲線較好地符合了氣固反應類型的動力學曲線。
  18. The samples were characterized contrastively by sem, tem, saed, positron annihilate and the different mechanism for two methods were preliminarily discussed. the experimental results showed that nano - cuo prepared by sol - gel method was spherical, which was agglomerated badly and can aging easily. however, nano - cuo prepared by pressure - hydrothermal method has loose and thin - piece appearance structure

    結果表明，溶膠-凝膠法制得的氧化銅粉末呈類球形，團聚嚴重，易老化；而壓力-熱液法制得的氧化銅具有疏鬆的、薄片狀的外觀結構，粒子厚度約為20nm ，分散性較好、抗老化能力強；壓力-熱液法制備的氧化銅比溶膠-凝膠法制備的氧化銅缺陷濃度小。
  19. Method of measurement of thickness for mica blocks, thins, films and splittings

    雲母塊薄片薄膜和碎片的厚度測量法
  20. The automatically inspect and control system for thickness of tire cord fabrics is not equipped for the calendar machines that made in china up to now. because of the thickness of tire cord fabrics is measured and controlled by manual, the quality of products cannot be guar anteed and a lot of rubber compound were wasted. in the article, the data process and data read of the other calendaring process parameters have designed

    另外，由於被控制膠片厚度較薄，若控制系統執行機構大幅度動作，嚴重時有可能造成壓延機兩輥相抵，使輥筒斷裂等重大的設備事故，因此，在常規控制的基礎上，通過採用增量式調節的特點，來實現厚度的自動控制，建立並推導切合現場實際使用的數學檢測公式和數學控制模型，然後通過編制相應的計算機軟體來實現控制的目的， 。
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