雜質分佈測量 的英文怎麼說

中文拼音 [zázhífēnbùcèliáng]
雜質分佈測量 英文
impurity profile measurement
  • 雜 : Ⅰ形容詞（多種多樣的; 混雜的） miscellaneous; varied; sundry; mixed Ⅱ動詞（混合在一起; 攙雜） mix; blend; mingle
  • 質 : Ⅰ名詞1 （性質; 本質） nature; character; essence 2 （質量） quality 3 （物質） matter; substance;...
  • 分 : 分Ⅰ名詞1. （成分） component 2. （職責和權利的限度） what is within one's duty or rights Ⅱ同 「份」Ⅲ動詞[書面語] （料想） judge
  • 測 : 動詞1. （測量） survey; fathom; measure 2. （測度; 推測） conjecture; infer
  • 量 : 量動1. （度量） measure 2. （估量） estimate; size up
  • 雜質 : [固體物理] impurity; foreign substance; impurity substance; inclusion; foreign matter
  • 測量 : measure; survey; gauge; meter; measurement; measuring; surveying; mensuration; metering; gauging;...
  1. We analysis some samples such as new semi - conductor gaas, new photoelectric material gan et al., and get these depth spectrums

    應用以上技術測量了c / lif多層膜、 gan膜和labacuo超導膜等多種樣品的成分及雜質的深度分佈。
  2. There are three difficulties and key problems in this papaer : : the first problem is what is the dominance bearing of the leakage fractures, and how the bedrock fracture water distribute, the second is how to test the complex chemical behavior in experiment way and quantify the relative parameters, the last question is how to number the transportation of the element 90sr and its pollution to solve the three problems, this paper does lots of work and come to the prospective order, the creativities in this thesis as follow : ( 1 ) the dominance bearing of the leakage fractures and the distribution feature of the fracture water are ascertained based on rich geological data, these basal researches are very important, which are the premises to build the transport model of the fracture water in hae field

    本項研究工作的難點和關鍵問題有三個： hae處置場基巖裂隙系統中，導水裂隙的優勢方位是什麼，基巖裂隙水活躍帶分佈情況如何；怎麼對核素遷移的復雜化學行為進行實驗室測試並取得有關定量化參數；怎樣數值化表現出溶質的遷移行為和污染情況本論文在解決以上三個問題上做了大量的工作，達到了預期的目的，其創新之處有以下三點： （ 1 ）通過地質資料的分析，首次提出了hae預選處置場基巖裂隙導水的優勢方位和基巖裂隙水活躍帶的大致分佈特徵。它是一個很重要的基礎性研究成果，是建立hae處置場水運動模型的前提。
  3. In the present research, scanning electron microscope ( sem ), laser raman spectroscopy ( lrs ), x - ray photoelectron spectroscopy ( xrs ), x - ray diffraction ( xrd ) and electron probe micro analysis ( epma ) were utilized to investigate the difference in micro - structure and elements distribution between domestic and foreign pdcs. combined with analysis on current manufacturing process, the mechanism for the difference was discussed. scanning electron microscope ( sem ), laser granularity analysis, atom emission spectroscopy ( aes ) and plasma emission spectroscopy ( icpaes ) are also utilized to investigate the grain shape and impurities of key material - diamond power

    本課題採用掃描電鏡、拉曼光譜、光電子能譜、 x -射線衍射分析、電子探針等方法分析了國內外聚晶金剛石-硬質合金復合片在微觀組織結構、元素成分分佈方面的差異，結合對現有燒結工藝的分析，研討了造成這些差異的機理；採用掃描電子顯微鏡、激光粒度分析、原子發射光譜、等離子發射光譜等方法對關鍵原材料-金剛石微粉的晶形、雜質含量進行了比較分析測試。
  4. At present, the problem in testing sheet resistance for micro - areas is that probes must be set up at the suitable locations by handwork. in order to know the wafer ' s impurity distributing, we need test many times, so will waste a lot of time. if the wafer ' s diameter would be 300mm, this problem will be more serious. in this paper, image analysis is introduced, through pre - processing and edge picking - up, the probe tips are recognized. then probe tips will be aligned respectively in two perpendicular directions through driving stepper motors. thus the distribution of sheet resistance for whole wafer is got by automatic testing and it offers information for detecting the impurity distribution and the diffusion uniformity

    這樣，完成200mm （ 8時）圓片雜質的擴散分佈需要對許多圖形進行測試，需要花費很長的時間，當測試300mm矽片時問題就更為突出。本文將圖象與視覺測量系統引入四探針測試系統中，對採集到的原始探針圖像進行預處理、邊緣提取等操作，以便實現探針針尖的識別，然後由電機控制實現探針的自動定位。這樣測試系統可以自動獲得全片的薄層電阻分佈，為超大規模集成電路檢測雜質分佈和擴散的均勻性提供信息。
  5. Because the internal structure of high - speed long - range flying objects ( hslrfo ) is so complicated and the mass distribution is extremely non - uniform, the precision of the mass characteristic parameters obtained from theoretical calculation is not enough to be applied to the practical measurement and control. the special test system for the mass characteristic parameters of high - speed long - range flying objects, therefore, is in great need and it is also necessary to study its performance

    由於高速遠程飛行物體的內部結構非常復雜，質量分佈不均勻，在科學研究過程中進行的理論計算得到的質量特性參數與其使用要求相差甚遠，基本不能作為計算和測控參數使用，因此必須研製專用的測量系統，並對測量系統的測量特性進行研究。
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