microscope force 中文意思是什麼

microscope force 解釋
顯微鏡鑷
  • microscope : n 顯微鏡。 a binocular microscope 雙目顯微鏡。 an electron microscope 電子顯微鏡。 a field ion em...
  • force : n 1 力，勢。2 體力，氣力，精力，魄力。3 暴力，壓力；兵力，武力。4 〈pl 〉 部隊，軍隊，兵力。5 勢...
  1. In this paper, the flow pattern defects ( fpds ) were revealed by secco etchant and their shape, distribution on wafer and tip structure were studied in details by optical microscope and atomic force microscope ( afm ). the relationship between etching time and the tip structure of fpds was also discussed. furthermore, by studying the effect of rapid thermal annealing ( rta ) on the density of fpds in ar, the annihilation mechanism of fpds was discussed in this paper

    本文將cz硅單晶片在secco腐蝕液中擇優腐蝕后，用光學顯微鏡和原子力顯微鏡對流動圖形缺陷（ flowpatterndefects ， fpds ）在矽片中的形態、分佈及其端部的微觀結構進行了仔細地觀察和研究，並討論了腐蝕時間對fpds缺陷端部結構的影響；本文還通過研究ar氣氛下快速退火（ rapidthermalannealing ， rta ）對fpds缺陷密度的影響，初步探討了fpds的消除機理。
  2. Surface microtopography, representation and tracing of nacreous layers of pteria penguin and blister pearl from sanya, hainan province, are studied by using interference microscope and environmental scanning electron microscope and atomic force microscope

    摘要採用干涉顯微鏡、環境掃描電子顯微鏡、原子力顯微鏡對海南三亞企鵝貝及其附殼珍珠的珍珠層表面微形貌進行了研究。
  3. Abstract : molecular deposition ( md ) film, a nano film, is assembled by the interaction of static charge between cationic and anionic compounds. the micro - friction properties of an md film on silica has been studied with atomic force microscope ( afm ). it has been found that the md film has lower coefficient of friction as compared with the original surface of silica. moreover, based on the analyses of the surface force versus distance curves, photographic image, friction force image, and modulated force image, it is concluded that the friction reduction effect of md film on silica is attributed to the surface adhesion reduction and surface micro - modification

    文摘:利用原子力顯微鏡對石英巖表面單層分子沉積膜的微觀摩擦特性進行了研究，發現該分子沉積膜具有一定的減摩性.通過對其表面力-位移曲線、表面形貌像、調制力像和摩擦力像的進一步分析表明，石英巖表面分子沉積膜具有減摩作用的原因在於它能夠降低表面的粘著力並對表面具有微觀修飾作用
  4. Atom force microscope

    原子力顯微鏡
  5. ( 2 ) the images of aam were characterized by scanning electron microscope ( sem ), transmission electron microscope ( tem ) and atom force microscope ( afm ). the results indicated that pores in the as - prepared aam templates owned nearly the same diameter, parallel arrangement, huge density and formed nano - pore arrays

    （ 2 ）用sem 、 afm和tem等分析方法對aam的形貌進行了表徵，結果表明：制得的aam中含有大小均勻一致、排列規整、密度較大的納米孔陣列，為模板-電沉積法制備cdse納米線陣列奠定了良好的基礎。
  6. Application of atomic force microscope on polymer study

    原子力顯微鏡在材料研究中的應用
  7. The application of atomic force microscope for materials

    原子力顯微鏡在生物醫學中的應用
  8. The application of atomic force microscope in dna research

    原子力顯微鏡在生物學研究中的應用進展
  9. Progress in biological application of atomic force microscope

    原子力顯微鏡在生物醫學研究中的應用
  10. The application of atomic force microscope to clay minerals

    原子力顯微鏡在粘土礦物學研究中的應用
  11. Application progress of atomic force microscope to polymer science

    原子力顯微鏡在高分子領域的應用進展
  12. Improved atomic force microscope imaging in liquid with active probe

    壓電探針應用於原子力顯微鏡液體成像的研究
  13. Afm, atomic force microscope

    原子間力?微鏡
  14. Investigation of the diamond tip wear of an atomic force microscope in micro - machining

    碳納米管原子力顯微鏡針尖的研究
  15. Atomic force microscope, afm

    原子力顯微鏡
  16. Besides, the growth of gasb expitaxy film was monitored by reflection high energy electron diffraction ( rheed ). the rheed images and intesity oscillation are collected by computer system. it showed that the gasb film prepared in 400 was amorphous and it became monocrystalline when the temperature rose to 500. atomic force microscope ( afm ) was applied to analyse the surface morphology of the films which were grown in diffrent growth rates or substrate temperature. the analysis were compared to simulation results. the experiment results indicated it was easy to form clusters when the rate of growth is high or

    此外，本文通過反射式高能電子衍射（ rheed ）監測了gasb外延薄膜的生長，利用rheed強度振蕩的計算機採集系統實現了rheed圖像和rheed強度振蕩的實時監測。實驗發現在400生長的gasb薄膜為非晶態，溫度升高到500薄膜轉變為單晶。利用原子力顯微鏡對不同生長速率和襯底溫度生長的gasb薄膜的表面形貌進行觀察分析，並與模擬結果進行比較。
  17. The properties of thin films have been investigated with modern analysis technique, such as afm ( atom force microscopy ), sem ( scanning electron microscope ), xrd ( x - ray diffraction ) and rocking curve ( - scan ). and the properties of ybco thin film and its substrate and deposition temperature have been analysed, comparing with lao substrate ' s crystallization quality, ybco thin film properties, such as morphology and degree of grain alignment, was concluded to correlate with the crystal orientation uniform of lao substrate as revealed by xrd

    本文結合afm 、 sem研究ybco薄膜的表面形貌， xrd 、 fwhm分析薄膜的結晶情況，並結合成膜溫度和基片的質量進行一系列結構與性能的對比研究，發現laalo3 （ lao ）基片的質量對ybco薄膜的結構完整性有很大影響，不僅影響了薄膜的c軸取向性，而且影響了ybco的超導性能。
  18. The substrates modified by polylysine ( polylysine - substrate ), 3 - aminopropyltriethoxylsilane ( apts - substrate ) and 3 ' - glycidoxypropyltrimethoxysilane ( gops - substrate ) were imaged by atomic force microscope ; the microarrays, which were printed by microspotting device or microchannels on the modified substrates, were observed by fluorescence microscope

    摘要應用了多聚賴氨酸以及硅烷化試劑3 -氨丙基三乙氧基硅烷和3 - （ 2 ， 3環氧丙氧）丙基三甲氧基硅烷修飾硼玻璃襯底，並用微點陣點樣儀和微通道在其上印刷微點陣。
  19. Surface microtopography, representation and tracer of microscale vortex dislocation of hydrothermal synthetic sapphires and natural beryls are studied by using atomic force micro - scope and interference microscope

    摘要採用原子力顯微鏡、干涉顯微鏡對水熱法合成藍寶石和天然綠柱石等寶石的表面微形貌進行了研究。
  20. The surface morphologies of thin films were observed by using scan electron microscope ( sem ) and atomic force microscope ( afm ). based on grazing incidence x - ray diffraction ( gixrd ) equipment, we find that residual stress exist in magnetron sputtering plct film, in addition, the ferroelectric properties of plct thin films were measured by radiant premier lc type multifunctional ferroelectric properties test system

    利用廣角x射線衍射技術對不同濺射工藝下plct薄膜的相結構進行了研究;採用掃描電子顯微鏡（ sem ）和原子力顯微鏡（ afm ）分別觀察了薄膜的表面形貌;利用掠入射x射線衍射（ gixrd ）測量了薄膜的殘余應力。
分享友人
分享到 Line

分享到臉書