sapphire substrate 中文意思是什麼

sapphire substrate 解釋
藍寶石襯底
  • sapphire : n. 1. 【礦物】藍寶石。2. 天藍色,蔚藍色。adj. 天藍色的;蔚藍色的。
  • substrate : n. 1. 底層,地層。2. 【無線電】(半導體工藝中的)襯底,基底。3. 【生物學】(生態學中的)基層;【生物化學】受質;被酶作用物。
  1. C - plane sapphire substrate for opto - electronic applications as nitride based led is one of the latest additions to our sapphire product line. over the years, sapphire has proven to be a reliable base substrate to grow gallium nitride epitaxial film for high brightness led

    C -軸切型的藍寶石是近年來應用在生長氮化鎵藍光led重要的基材。兆晶科技新近增加此產品以因應光電業者殷切的需求。
  2. The purpose of this dissertation is to study the effect of substrate on the characteristics and microstructure of high temperature superconducting yba2cu3o7 - thin film, and well c - axis oriented epitaxial ybco thin films have been deposited on both laalo3 ( 100 ) and r - plane sapphire al2o3 ( 102 ) substrates by inverted cylindrical dc sputtering ( icds ) technique

    =本論文的目的是研究基片對薄膜結構和性能的影響關系,採用倒筒靶直流濺射技術在在laalo3 ( 100 )和r -平面的藍寶石( al2o3 ( 102 ) )兩種基片上制備出c軸取向的外延高溫超導yba2cu3o7 -薄膜。
  3. The main contents and results are listed as follows : with the help of opfcad software, anti - reflective and protective films of sio2 and sio2 / si are designed on the sapphire substrate and analysis of structure sensitive factor and variation are done

    主要研究成果如下:利用opfcad軟體在藍寶石襯底上設計了sio _ 2 、 sio _ 2 si等增透保護膜系,並對所設計的膜系進行了結構敏感因子( n , d )及結構偏差分析。
  4. The effect of deposited condition, include substrate temperatures, different substrates and annealing on the structural properties of zno films has been studied in considerable detail. it is found that the optimal conditions to deposit zno are below : the substrate temperature of 450c, the substrate of sapphire. the sample on this condition is 0. 3491

    通過分析襯底溫度、不同襯底和退火對樣品結構的影響,得到了樣品的最佳制備條件:襯底溫度450 、藍寶石襯底,此條件下制備的樣品具有高度( 002 )取向性, ( 002 )衍射峰半高寬僅僅0 . 3491 ,原子力顯微鏡( afm )分析表明zno薄膜具有密集堆積的均勻柱狀晶粒。
  5. The gas sources that we used are trimethylgallium ( tmg ) and 99. 9999 % purity nitrogen, which were fed into reaction chamber and resonance cavity respectively. the highly dense ecr plasma up to 1011cm - 3 was created in the resonance cavity and introduced to the next reaction chamber by the force of divergent magnetic field. consequently, gan thin film was grew on the substrate sapphire ( 0001 ) placed in the downstream

    實驗採用有機金屬三甲基鎵氣源( tmg )和99 . 9999純度的氮氣,在ecr - pecvd150裝置共振腔內電子迴旋共振吸收微波能量產生的高密度ecr等離子體在磁場梯度和等離子體密度梯度的作用下向下級反應室擴散,在放置於下游區樣品臺上的- al _ 2o _ 3襯底表面附近發生物理化學反應沉積成gan薄膜。
  6. The experiment results showed we had got well nanowires on si and sapphire substrate and the au and ag act catalyst respectively, we got zno nanowires array on si and sapphire substrate using the ag as catalyst. 2. we measured the pl spectrum of zno nanowires samples excited by an ultraviolet fluorescence spectrophotometer in different wavelength

    實驗結果顯示分別採用金和銀為催化劑在硅襯底和藍寶石襯底上制備出結晶質量較好的納米線,其中在銀催化的硅基片和藍寶石基片上制備出排列整齊的納米線陣列。
  7. Superconducting mgb2 thin films were fabricated on single - crystal sapphire substrate by hfcvd and hpcvd, respectively. the experiments were carried out both in situ and ex situ. in situ method refers to acquiring mgb2 thin films directly during the deposition process. ex situ method is defined as obtaining mgb2 thin films indirectly by post - annealing of precursor b film in high mg vapor pressure at high temperatures

    實驗分原位法和非原位法兩種工藝,原位法是在薄膜沉積過程中直接生成了mgb2超導薄膜;非原位法是先在基片上沉積前驅物b膜,然後將b膜在mg蒸氣中高溫退火得到mgb2超導薄膜。
  8. In this paper, the growth technology is presented for epitaxial silicon carbide films on sapphire with a buffer layer by atmospheric - pressure chemical vapor deposition ( apcvd ) process. the effect of temperature and precursors flow rates on the growth of silicon carbide films by chemical vapor deposition is analyzed. the structural properties of the films grown on sapphire compound substrate are studied by x - ray diffraction ( xrd ), x - ray photospectroscopy ( xps ) and photoluminescence spectroscopy

    本論文提出了在藍寶石上引入一層緩沖層材料形成復合襯底,採用常壓化學氣相淀積( apcvd )方法在其上異質外延生長sic薄膜的技術,分析了cvd法生長sic的物理化學過程,通過實驗提出sic薄膜生長的工藝條件,並通過x射線衍射( xrd ) 、 x射線光電子能譜( xps ) 、光致發光譜( pl譜)和掃描電鏡( sem )對外延薄膜的結構性質進行分析。
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