test access port 中文意思是什麼
test access port
解釋
測試存取埠-
Standard test access port and boundary scan architecture
標準測試存取口及邊界掃描體系結構 -
Test access port and boundary - scan architecture
測試存取口及邊界掃描結構 -
On the other hand, boundary - scan technique intelligent fault diagnostic method was applied to practice. for most digital system, devices with boundary - scan architecture are broadly used. only using four line or five line to connect pc parallel port with cut tap ( test access port ), all the ptvs can be loaded to cut and all homologous prvs can be taken back to intelligent fault diagnosis system
至於本文採用邊界掃描測試故障診斷技術,是考慮到本系統的通用性和簡潔性,因為對于大多數數字系統而言,具有邊界掃描結構的器件己廣泛應用,本文只需4條或5條信號線就能將pc機和被測邊界掃描電路連接起來,由此極大地簡化了智能故障診斷系統中為實現ptvs加載和prvs獲取而專門設計的介面板電路。 -
Tap test access port
測試存取埠 -
This structure not only achieves the purpose of hardware logic partition but also makes it convenient for the generation of test stimulus, fault simulation, and online debugging. furthermore, we make internal scan share the test access port, so the pin ’ s cost which brings for test is reduced
此外為減少晶元引腳開銷,我們還把內部掃描和邊界掃描集成在一起,使其共用測試引腳,降低了因測試而帶來的晶元引腳開銷。
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