x ray energy spectrum 中文意思是什麼

x ray energy spectrum 解釋
x射線能譜
  • x : X2＝ （羅馬數字）10 XX ＝ 20 IX ＝ 9 XV ＝ 15 XL ＝ 40 LX ＝ 60 XC ＝ 90 DXL ＝ 540 MX ＝ 1010 ＝...
  • ray : n 雷〈姓氏，男子名， Raymond 的昵稱〉。n 1 光線，射線，熱線；〈詩〉光輝，閃爍，曙光，一線光明。2 ...
  • energy : n. 1. 干勁，活力。2. （語言、行為等的）生動。3. 〈pl. 〉 （個人的）精力；能力。4. 【物理學】能，能量。
  • spectrum : n. （pl. -tra ）1. 【物理學】譜，光譜；波譜；能譜，質譜。2. 【無線電】射頻頻譜；無線電（信號）頻譜。3. 【心理學】（眼睛的）余像；殘像。4. 〈轉義〉范圍，幅度；（連續的）系列。
  1. Measuring x - ray energy - spectrum emitted by these laser - produced plasmas is a important diagnose method, because they emit a mass of x - ray

    激光等離子體釋放出大量的x射線，因此對x射線進行攝譜分析是一種重要的診斷方法。
  2. In icf ecperiment, the x ray produced by laser plamsa mainly distributes in sub - kilo electron volt region, whose overall energy, energy - spectrum characteristic, projecting time and its distribution in space are basic dataes in theory and experiment

    在icf實驗中，激光等離子體產生的x光主要分佈在亞仟電子伏特區（ 0 . 1 - 1 . 5kev ） ，它的總能量、能譜特徵、發射時間過程和空間分佈都是理論和實驗極為關心的基本數據。
  3. Reference to the convention means of the analysis and research for energy spectrum hardening and photon scattering in internal and external, and based on the physical mechanism of radial interacts with matter, this paper approximatively deduce a theoretical formula of correction of energy spectrum hardening and scattered radiation in transmission industrial x - ray computerized tomography from a ideal model. and presented a correction computer program

    本文在分析研究國內外有關射線能譜硬化和散射修正問題的分析方法及其研究狀況的基礎上，從射線同物質相互作用的物理學機理出發，從理論上近似推導了x射線能譜硬化和散射修正計算公式，建立了散射修正的分析模型，並編制了相應的計算機修正程序。
  4. The phase structure of different cu - fe thin films were studied by using grazing incidence x - ray analysis ( gixa ). the texture and residual stress of different cu - fe thin films were measured by scan of x - ray diffraction ( xrd ) and 2 scan with different. the thicknesses of different thin films were characterized by means of small angle x - ray scattering ( saxs ) technique. by using atomic force microscope ( afm ) measured surface roughness of thin films. the component of different thin film was characterized by energy disperse spectrum ( eds ) and x - ray fluorescence ( xrf ). the magnetic properties of cu - fe thin films were measured by means of vibrating sample magnetometer ( vsm ). in addition, the giant magnetoresistance ( gmr ) effects of different films were also measured. the original resistance of the film fabricated by a direction - current magnetron sputtering system is directly affected by bias voltage

    利用掠入射x射線分析（ gixa ）技術對不同cu - fe薄膜的相結構進行了研究;利用xrd掃描及不同角度的2掃描對薄膜進行了結晶織構及殘余應力分析;運用小角x射線散射（ saxs ）技術測量了薄膜的厚度;採用原子力顯微鏡（ afm ）觀察了薄膜的表面形貌;運用能量損失譜（ eds ）及x射線熒光光譜（ xrf ）對薄膜進行了成分標定;使用振動樣品磁強計測量了不同cu - fe過飽和固溶體薄膜的磁性能;最後利用自製的磁阻性能測試設備測量了真空磁場熱處理前後不同薄膜的巨磁阻值。
  5. The composition and mechanism of cdse thin films were explored by x - ray energy dispersion analysis ( eds ) and x - ray penetration spectrum ( xps ). the effect of electro - deposition conditions such as potential ( vs. sce ) of cathode, concentration of electrolyte on composition and mechanism of as - fabricated cdse thin films were gained, which provided experimental foundation and ideal basis for template - electro - deposition preparation of cdse nano - wire arrays

    採用eds和xps兩種分析方法對cdse薄膜的組成進行了表徵，得到了陰極電位值（ vs . see ）和電解液濃度對edse薄膜組成的影響關系，為以hzseo3和seso32 -為硒源，用模板一電沉積法制備cdse納米線陣列提供了實驗依據和理論基礎。
  6. General specification of transmission electron microscope - x - ray energy dispersive spectrum quantitative microanalysis for thin biological specimens

    生物薄試樣的透射電子顯微鏡- x射線能譜定量分析通則
  7. Hxmt can achieve the following science missions : ( 1 ) observing the hard x - ray in the whole space and plotting its distributional map. ( 2 ) image observing the interested space deeply. ( 3 ) continuously and sensitively observing the special celestial bodies, and gained the energy spectrum and changes with time of the celestial bodies " radiation

    它能完成下述科學任務： （ 1 ）完成硬x射線巡天觀測，描繪硬x射線天圖； （ 2 ）對感興趣天區作深度的成像觀測； （ 3 ）對特殊的天體作高靈敏度連續觀測，得到其輻射的能譜和時間變化。
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