x-ray spectroscopy 中文意思是什麼

x-ray spectroscopy 解釋
x線光譜學
  • x : X2＝ （羅馬數字）10 XX ＝ 20 IX ＝ 9 XV ＝ 15 XL ＝ 40 LX ＝ 60 XC ＝ 90 DXL ＝ 540 MX ＝ 1010 ＝...
  • ray : n 雷〈姓氏，男子名， Raymond 的昵稱〉。n 1 光線，射線，熱線；〈詩〉光輝，閃爍，曙光，一線光明。2 ...
  • spectroscopy : n. 【物理學】分光術，光譜學。n. -ist
  1. Chiral quaternary ammonium salts were synthesized from cinchonine in cinchona alkaloids using chloromethylated polystyrene - polyethylene glycol, diethylene glycol, triethylene glycol and glycol as polymer - supported phase transfer catalysts, finsl products were characterized by ftir, elemental analysis, scanning electron microscopy, x - ray photoelectron spectroscopy ( xps )

    摘要以金雞納生物堿中的辛可寧為原料，氯甲基化聚苯乙烯聚乙二醇、一縮二乙二醇、二縮三乙二醇、乙二醇等為載體合成了幾種聚合物負載的手性季銨鹽，並對它們的結構用紅外光譜、元素分析、掃描電鏡和x射線光電子能譜等測試手段進行了表徵。
  2. Online non - contact laser type thickness measuring systems, online non - contact x - ray type thickness measuring systems, offline desktop contact thickness measuring systems, offline desktop electrical capacity contact thickness measuring systems, infrared type thickness measuring systems, interference spectroscopy type thickness measuring systems

    在線非接觸激光厚度測量裝置，在線非接觸x線厚度測量裝置，在線臺式接觸式厚度測量裝置，在線臺式靜電容量式厚度測量裝置，紅外線厚度測量裝置，分光干涉式厚度測量裝置
  3. The structures and characteristics of several graphite samples are measured by means of powder x - ray diffraction ( xrd ), brunauer - emmer - teller ( bet ) surface area measurement, inductively coupled plasma ( icp ) spectroscopy, particle size analysis and electrochemical measurements. the effects of origin, structure, impurity, particle size, specific surface area of carbon materials on the electrochemical characteristics are studied. a synthetic graphite with abundant resources, low cost and favorable performance is determined as the raw material for modification of graphite

    採用xrd 、 bet 、 icp 、激光粒徑分析及電化學性能測試等方法，對國內外多種典型石墨樣品的結構與性能進行比較，研究石墨材料的來源、晶體結構、雜質含量、顆粒大小、比表面積等因素對其充放電性能的影響，確定一種性能較好、價格低廉、來源廣泛的普通人造石墨粉作為熱處理與摻雜改性、以及復合結構炭材料研究的原材料。
  4. X - ray photoelectron spectroscopy studies of archeological bronzes

    青銅文物光電子能譜分析
  5. Firstly, the tio2 thin films are deposited by dc reactive magnetron sputtering apparatus, and characterlized by n & k analyzer1200, x - ray diffraction spectroscopy ( xrd ), scanning electronic microscopy ( sem ), alpha - step500. and it was analyzed that the effect on performance and structure of films with the change of argon flow, total gas pressure, the substrate - to - target distance and temperature

    第一、應用穩定的直流磁控濺射設備制備tio2減反射薄膜並通過n & kanalyzer1200薄膜光學分析儀、 x射線衍射分析（ xrd ） 、掃描電子顯微鏡（ sem ） 、 alpha - step500型臺階儀等儀器對薄膜進行表徵，分析氧分壓、總氣壓、工作溫度、靶基距等制備工藝參數對薄膜性能結構的影響。
  6. The as - grown crystals were characterization by cutting and directional, x - ray diffraction, high resolution ohmmeter, ir transmission spectroscopy, visible light absorption spectroscopy, scan electronic microscopy ( sem ) and positron annihilate time technique ( pat ). the ir transmittance of czt single crystals grown with cd - riched is about 53 %, while 23 % with no cd riched

    採用解理實驗、 x射線衍射、電學性能測試、紅外透過譜測試、可見光吸收譜測試、 sem蝕坑分析、探測器的試制等分析測試方法，並首次採用正電子湮沒壽命譜分析方法來研究czt單晶體的空位缺陷，綜合表徵了所生長的晶體的質量和性能。
  7. Components, structure and surface morphology of the resulted films were identified by fourier transform infrared ( ftir ) spectroscopy, x - ray diffraction ( xrd ) and scanning electronic microscopy ( sem ). the analyses showed the content of cubic boron nitride in the resultant films on substrates was rather high and crystal particles of c - bn with uniform size, smooth crystal plane and regular shapes ( quadrangle and hexagon ) densely arrayed on the substrate

    傅里葉轉換紅外吸收（ ftir ）光譜儀、 x射線衍射（ xrd ）儀和掃描電鏡（ stm ）的測量結果顯示，基底上的bn膜中立方相含量很高，且晶粒大小均勻、排列緻密，晶形呈規則的四角和六角形。
  8. The contents of metal elements in silk gland and silk fiber of b. mori silkworm have been detailedly analyzed by proton induced x - ray emission ( pixe ), inductively coupled plasma mass spectroscopy ( icp - ms ) and atomic adsorption spectroscopy ( aas )

    摘要用不同的測試方法，即質子誘導x射線發射（ pixe ） 、電感耦合等離子體質譜（ icp - ms ）和原子吸收光譜（ aas ）對桑蠶絲腺體和絲纖維中金屬元素的含量進行了詳細的表徵。
  9. Standard test method for determination of bromine and chlorine in uf6 and uranyl nitrate by x - ray fluorescence spectroscopy

    用x射線熒光光譜測定法uf - 6和硝酸鈾酰中溴和氯的含量的標準試驗方法
  10. The crystalline structure changes of pp induced by pan - milling were characterized by x - ray diffraction and raman spectroscopy. xrd analyses show that when pp was co - milled with uhmwpe, crystal transformation of pp occurred, its crystallinity and crystallite size decreased, whereas, only slight reduction of crystallinity and crystallite size were observed and no crystal transformation was found when pp was co - milled with wtr chips, and amorphization of pp was strongly enhanced by co - milling pp with iron

    採用x -射線衍射研究了聚丙烯碾磨粉碎過程微觀結構變化， uhmwpe存在下pp發生晶型轉變、結晶度降低和晶粒尺寸減小；彈性材料wtr抑制pp塑性變形，碾磨導致分子堆積有序區域膨脹，晶面間距增大，結晶度下降；剛性材料金屬鐵與pp產生強烈摩擦，加快晶粒細化，晶格破裂導致非晶化。
  11. Treatment of the spinel limn2o4 with aqueous acid produces - mno2. x - ray diffraction and atomic absorption spectroscopy show that - mno2 with lattice constant of 0. 806nm preserves the structural framework of the limn2o4 and the conversion of limn2o4 to - mno2 results in some contraction of the lattice

    利用limn2o4與稀酸作用制得- mno2 ，經xrd 、原子吸收光譜（ aas ）分析表明- mno2仍然保持了尖晶石的面心立方點陣，晶胞參數0 . 806nm ； limn2o4經過酸處理、鋰離子脫出后晶胞體積發生了收縮。
  12. Surface states and the topmost surface atoms of the batio3 thin films have been analyzed by x - ray photoelectron spectroscopy ( xps ) and angle - resolved x - ray photoelectron spectroscopy ( arxps ). the results show that the as - grown batio3 thin films have an enriched - bao nonstoichiometric surface layer which can be removed by ar + ion sputtering, and the atomic ratio of ba to ti decreases with increasing the depth of ar + ion sputtering

    用x射線光電子能譜技術（ xps ）和角分辨x射線光電子能譜技術（ arxps ）研究了薄膜的表面化學態以及最頂層原子種類和分佈狀況，結果顯示在熱處理過程中薄膜表面形成一層富含bao的非計量鈦氧化物層，並且鋇-鈦原子濃度比隨著探測深度的增大而逐漸減小。
  13. The cenosphere particles were characterized with optical microscope, field emission scanning electron microscopy ( fesem ), energy - dispersive spectroscopy ( eds ) and x - ray diffraction ( xrd ) in and after the plating

    用光學顯微鏡、場發射掃描電子顯微鏡、能譜儀和x射線衍射儀對其進行了分析表徵。
  14. Hexadecyl hydrogen maleate ( hhm ) is a new kind of analyzer crystal for soft x - ray spectroscopy, with a large 2d spacing of 58. 58a. hhm is hoped to give a better growth habit than octadecyl hydrogen maleate ( ohm ), because of its shorter chain length and narrower 2d spacing. in this paper, a large hhm single crystal of dimensions 60mm x 40mm x 3mm was obtained in the benzene solution by lowing the solution temperature

    馬來酸氫十六酯（ hhm ）是一種新型的軟x ?射線分光晶體，晶面間距2d等於58 . 58a ，與ohm （馬來酸氫十八酯）屬同一系列分光晶體，碳鏈的縮短、晶面間距的減小有望給出比ohm更好的生長和結晶習性。
  15. The morphologies of powder were observed by using high - resolution transmission electron microscopy ( hrtem ) ; x - ray diffraction ( xrd ) pattern was used to analyze the phases of the powder ; energy dispersive x - ray spectroscopy ( edx ) was used to analyze the component of composite powder

    用高分辨電鏡觀察復合粉體的形貌，進行電子衍射分析；用d / 3ax3b型x射線衍射儀作復合粉體的物相分析；用pv9900型能譜儀作復合粉末的成分分析。
  16. The effect of growth parameters on the morphology, structure and chemical compositon of sic whiskers have been characterized by x - ray diffraction ( xrd ), scanning electron microscope ( sem ), energy dispersive x - ray spectroscopy ( eds ) and transmission electron microscope ( tem )

    運用x射線衍射（ xrd ） 、掃描電子顯微鏡（ sem ） 、電子能量色散譜（ eds ） 、透射電子顯微鏡（ tem ）等表徵手段，系統研究了工藝參數對sic晶須形貌、結構和化學成份的影響。
  17. Test method for lead in gasoline by x - ray spectroscopy

    用x -射線光譜法測定汽油鉛含量的方法
  18. " for his discoveries and research in the field of x - ray spectroscopy

    發現x射線中的光譜線
  19. Standard test methods for lead in gasoline by x - ray spectroscopy

    X射線分光光度法測量汽油中鉛含量的標準試驗方法
  20. In succession, tini thin film is deposited on single - crystal silicon substrate using optimized parameters utilizing sputtering, and its transformation temperature ( a * ) is 72 ? indicated by dsc curve after being annealed in an ultra - high vacuum ( uhv ) chamber. in addition, the composition of the silicon - based tini film was analyzed by an energy dispersive x - ray spectroscopy ( eds ), and the ti content in the film is approximately 51at %

    按照改進的工藝參數，在單晶硅襯底上濺射-淀積了tini薄膜，並進行了超高真空退火， dsc法測得其馬氏體逆相變峰值溫度為72 ，利用能譜分析（ eds ）技術測得其ti含量約為51at ，通過對非晶tini薄膜與單晶硅襯底之間的界面進行eds及x射線衍射（ xrd ）分析，發現在用大功率（ 2000w ）直流磁控濺射法制備tini薄膜過程中，存在ti 、 ni與si的雙向擴散，發生了界面反應，並有三元化合物ni _ 3ti _ 2si生成。
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