橋接故障 的英文怎麼說

中文拼音 [qiáojiēgùzhàng]
橋接故障 英文
bridge fault
  • 橋 : 名詞1. （橋梁） bridge 2. （姓氏） a surname
  • 接 : Ⅰ動詞1 （靠近;接觸） come into contact with; come close to 2 （連接; 使連接） connect; join; put ...
  • 故 : Ⅰ名詞1 （事故） event; incident; happening; accident 2 （原因） cause; reason 3 （朋友; 友情） fr...
  • 障 : Ⅰ動詞（阻隔; 遮擋） block; hinder; obstruct Ⅱ名詞（遮擋物） barrier; block; obstacle
  • 故障 : hitch; breakdown; stoppage; fault; faulting; accident; blunder; bug; conk; failure; impairment; i...
  1. Benefit from designer experience, expert system regulations are built by c language. through the inference, all fixed logic fault and most multi - line short circuit fault are detected by expert system. on that account, the design process built by c language will be a mode that can be imitated by other intelligent fault diagnosis system

    對于專家系統智能故障診斷技術而言，構建專四川大學碩士學位論文家系統規則庫和設計推理機制是重點，本文採用c語言構建規則庫，然後通過精心設計的專家推理機，從而使得固定邏輯故障和大多數多線橋接故障能夠被專家診斷系統檢測出來。
  2. When those ptvs are sequentially loaded to cut ( circuit under test ) from intelligent fault diagnosis system, homologous prvs ( parallel response vector ) are taken back. through test response analysis by expert system, intelligent fault diagnosis system can detect all fixed ' 1 ' logic fault, fixed ' 0 ' logic fault, and detect the majority of multi - line short circuit fault

    當這些ptvs從pc機中依次加載到被測電路板后，相應的prvs （并行響應向量集）可以獲取供診斷系統進行測試響應分析，從而檢測出固定邏輯故障和橋接故障。
  3. Then the method of fault diagnosis in three - phase thyristor converter bridge based on spectrum analysis is discussed. and the fault model was simulated and analyzed again in the method, also fault diagnosis criterion is gained in the condition

    接著，闡述了基於頻譜分析的三相全控整流橋故障診斷方法，並應用該方法對故障模型重新進行了模擬、分析，得出了相應的故障診斷判據。
  4. Not only fault model, but also test arithmetic demand to be farther improved. the thesis, focusing on the 20 - port register file, makes a fault analysis, particularly in complex bridge fault and crosstalk coupling fault aroused by word - line and bit - line of 20 - port

    本文針對所設計的寄存器文件進行了故障分析，特別對20埠字線、位線引起的復雜橋接故障和串擾導致的耦合故障進行了詳盡論述。
  5. Through the simulative experiments about iddq detecting bridge faults in cmos and bicmos circuits, the fault coverage of iddq can be estimated

    並對cmos電路與bicmos電路的橋接故障作了iddq檢測模擬實驗，分析了iddq檢測的故障覆蓋率。
  6. For the convenience of test, varied circuit chip defects caused by the production process are abstracted as all kinds of models. at present the commonly used fault models mainly consist of stuck - at fault, stuck - open fault, bridge fault, store fault, delay fault, etc. testing methods based on voltage testing mainly aim at stuck - at fault model and have also obtained satisfactory result in research for many years. bridge fault is tested easily by quiescent power supply current ( iddq ) testing method. in regard to stuck - open fault that is difficult to testd by quiescent power supply current ( iddq ) and voltage testing, it can is tested by the dynamic current ( iddt ) testing

    為了便於測試，我們將生產過程中集成電路出現的多種多樣的缺陷抽象為各種模型。目前常用的故障模型主要有:固定故障，開路故障，橋接故障，存儲故障，時滯故障等。電壓測試主要針對固定型故障模型，多年的研究也取得了令人滿意的結果; cmos電路中的橋接故障則宜用穩態電流測試方法（ iddq ）測試;對于電壓和穩態電流難以測試的開路故障，可以使用瞬態電流測試（ iddt ）的方法進行測試。
  7. The feasibility and effectiveness of the iddt testing are both validated by experiments. at last, transistor bridging faults are simulated based on iddq testing and gate bridging faults and stuck - at faults based on voltage testing through detaching a pattern pair into two independent patterns

    最後，把一個輸入向量對看成兩個獨立的向量，分別採用穩態電流測試方法和電壓測試方法模擬橋接故障的晶體管級故障和橋接故障的門級故障及固定故障。
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