互連薄膜 的英文怎麼說

中文拼音 [lián]
互連薄膜 英文
interconnection film
  • : 代詞(相互;彼此) each other; mutual
  • : Ⅰ動詞1 (連接) link; join; connect 2 (連累) involve (in trouble); implicate 3 [方言] (縫) ...
  • : 名詞[方言] (浮萍) duckweed
  • : 名詞1. [生物學] (像薄皮的組織) membrane 2. (像膜的薄皮) film; thin coating
  • 薄膜 : thin film; film; diaphragm
  1. Cr / cu / cr film has been widely used in mcm - d

    Cr cu cr是目前常用結構。
  2. The results indicate the stress of copper interconnects generates in the metallization and the thermal stress caused by thermal mismatch during the damascene process is the main stress. the thermal stress distribution in copper interconnects has been simulated by the finite element analysis software with the different trench structures

    對測量結果的分析得出金屬的淀積是造成銅線中應力的主要原因,熱應力在銅線應力中占較大比例,熱處理后銅線中應力減小。
  3. Studies on the stress of copper interconnects include the stress measurement by xrd, computer simulation and observation the local stress distribution with snam

    利用應力測試分佈儀和xrd測量硅基銅及銅宏觀應力。
  4. Materials for interconnection structures - part 8 : sectional specification set for non - conductive films and coatings - section 7 : marking legend inks

    接裝置用材料.第8部分:非導電和塗層裝置分規范.第7節:列印油墨
  5. Consequently, the metal interconnects of vlsi have smaller sectional area and carry increasing power density, which made the electromigration become one of the main latent damage modes

    作為vlsi線的金屬的截面積越來越小,其承受的功率密度急劇增加,使得電遷移成為電路的主要失效模式之一。
  6. Studies on the microstructure of copper interconnects include the determination of grain size by afm and sem, the measurement of texture by xrd and ebsd, the evaluation of barriers by xps and aes

    線的微觀結構的研究:通過afm 、 sem 、 tem等的分析方法對銅及銅的晶粒尺寸進行了評價。
  7. The results show the grain size becomes larger along with elevated temperature and the grain size in interconnects does not change evidently after annealed at 200 ? because of the effect of the trench structure

    結果顯示熱處理后銅晶粒長大,但銅由於溝槽結構對晶粒的長大有阻礙作用。利用xrd和ebsd測試方法對銅及銅的織構進行評價。
  8. Materials for interconnection structures - part 8 : sectional specification set for non - conductive films and coatings - section 8 : temporary polymer coatings

    結構材料.第8部分:不導電和塗層分規范集.第8節:非永久高聚物塗層
  9. Theoretical calculation on the mechanical characterization of ulsi two - layer interconnect films by surface acoustic waves

    布線雙層機械特性的理論計算
  10. Materials for interconnection structures - sectional specification set for non - conductive films and coatings - marking legend inks

    接結構用材料.不導電和塗層分規范.列印油墨
  11. Materials for interconnection structures. part 8 : sectional specification set for non conductive films and coatings. section 7 : marking legend links

    結構用材料.第8部分:非導電和塗層的分規范集.第7節:標記圖例鏈路
  12. Materials for interconnection structures. part 8 : sectional specification set for non - conductive films and coatings. section 8 : temporary polymer coatings

    結構用材料.第8部分:不導電和塗層用分規范集.第8節:暫時性聚合物塗層
  13. Materials for interconnection structures. part 5 : sectional specification set for conductive foils and films with or without coatings. section 4 : conductive inks

    結構用材料.第5部分:有塗層或無塗層的導電箔和的分規范集.第4節:導電油墨
  14. Materials for interconnection structures. part 5 : sectional specification set for conductive foils and films with and without coatings. section 1 : copper foils for the manufacture of copper - clad base materials

    結構用材料.第5部分:有塗層和無塗層的導電箔和的分規范集.第1節:銅箔
  15. Materials for interconnection structures - part 8 : sectional specification set for non - conductive films and coatings ; section 8 : temporary polymer coatings iec 61249 - 8 - 8 : 1997 ; german version en 61249 - 8 - 8 : 1997

    結構用材料.第8部分:非導電和塗層分規范集
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