晶圓探測器 的英文怎麼說
中文拼音 [jīngyuántàncèqì]
晶圓探測器
英文
wafer prober- 晶 : Ⅰ形容詞(光亮) brilliant; glittering Ⅱ名詞1. (水晶) quartz; (rock) crystal 2. (晶體) any crystalline substance
- 探 : Ⅰ動詞1 (試圖發現) try to find out; explore; sound 2 (看望) call on; visit; see 3 (向前伸出)...
- 測 : 動詞1. (測量) survey; fathom; measure 2. (測度; 推測) conjecture; infer
- 器 : 名詞1. (器具) implement; utensil; ware 2. (器官) organ 3. (度量; 才能) capacity; talent 4. (姓氏) a surname
- 晶圓 : mpw
- 探測器 : finder; detector; seeker; sounder; probe
- 探測 : survey; search; sound; probe; sounding; detection; acquisition; reconnaissance; localization; fin...
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One of the most important advancements recently for electroglas has been in gaining greater control over the z direction of the wafer prober, which affects the accuracy and impact force of touchdowns on wafers and enables their customers to effectively test even the most recent types of delicate devices
其中伊智公司最近最重要的一個進步就是:實現了對于晶圓探針臺z方向的更大程度的控制,這直接影響到探針接觸晶圓的精確性和沖擊力,為客戶提供了高效率的測試;即使是最新型的精細器件。Secondly, according to the basic theory of the general spectrometer, in this paper we discuss the fundamental, the compositions and the characters of tcecs. we analyze the main influencing factors for resolving power, such as the dispersion of the x - ray on the detection circle, spectra location error and the aperture width etc. and we put out the ways to resolving the problems
接下來,本文根據經典光譜儀器的基本理論,著重討論了雙通道橢圓彎晶譜儀的基本原理,及其基本組成和基本特性,並從x射線波長在探測圓上的彌散度、光度參數與探測角之間的關系、狹縫寬度等方面對譜儀的精度和解析度的影響作了一定的分析,並提出了解決問題的辦法。Because of this, nearly every major semiconductor manufacturer in the world relies on electroglas ‘ wafer probing technologies to help them maximize the overall efficiency of their wafer and device testing processes
正因為如此,幾乎全世界所有的半導體主要生產商都依靠伊智公司的晶圓探針技術來幫助他們全面提升晶圓和器件測試過程的效率。
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