掠射角技術 的英文怎麼說

中文拼音 [lüèshèjiǎojìshù]
掠射角技術 英文
glancing angle technique
  • 掠 : 掠動1 （掠奪） ransack; plunder; pillage; sack 2 （輕輕擦過或拂過） graze; brush past; skim over;...
  • 射 : Ⅰ動詞1 （用推力或彈力送出） shoot; fire 2 （液體受到壓力迅速擠出） discharge in a jet 3 （放出） ...
  • 角 : 角Ⅰ名詞1 （牛、羊、 鹿等頭上長出的堅硬的東西） horn 2 （古時軍中吹的樂器） bugle; horn 3 （形狀像...
  • 技 : 名詞（技能; 本領） skill; ability; trick; technique
  • 術 : 術名詞1. （技藝; 技術; 學術） art; skill; technique 2. （方法; 策略） method; tactics 3. （姓氏） a surname
  1. This demonstrates the feasibility of using grazing emission x - ray fluorescence spectroscopy as a method of studying the thin layer ' s characteristics, such as composition and thickiness etc. with the intimately combining of theoretical, set - up and experimental research, the study on the analysis techniques of grazing emission x - ray fluorescence is developed, and the first set of grazing emission x - ray fluorescence setup is established. at the same time, the angular dependence of the fluorescence intensity with different thickness layer is measured. all the work in this thesis provides the basis for the further researches

    本論文採用理論、裝置和實驗研究密切結合的方式，開展了掠射x射線熒光分析技術研究工作，在國內建立了首臺掠出射x射線熒光光譜分析裝置，並對不同厚度單層和雙層薄膜樣品在掠出射條件下產生的熒光光強與掠射角的對應博士學位論文:掠射x射線熒光分析技術研究關系進行了實驗測定。
  2. The surface morphologies of thin films were observed by using scan electron microscope ( sem ) and atomic force microscope ( afm ). based on grazing incidence x - ray diffraction ( gixrd ) equipment, we find that residual stress exist in magnetron sputtering plct film, in addition, the ferroelectric properties of plct thin films were measured by radiant premier lc type multifunctional ferroelectric properties test system

    利用廣角x射線衍射技術對不同濺射工藝下plct薄膜的相結構進行了研究;採用掃描電子顯微鏡（ sem ）和原子力顯微鏡（ afm ）分別觀察了薄膜的表面形貌;利用掠入射x射線衍射（ gixrd ）測量了薄膜的殘余應力。
  3. The phase structure of different cu - fe thin films were studied by using grazing incidence x - ray analysis ( gixa ). the texture and residual stress of different cu - fe thin films were measured by scan of x - ray diffraction ( xrd ) and 2 scan with different. the thicknesses of different thin films were characterized by means of small angle x - ray scattering ( saxs ) technique. by using atomic force microscope ( afm ) measured surface roughness of thin films. the component of different thin film was characterized by energy disperse spectrum ( eds ) and x - ray fluorescence ( xrf ). the magnetic properties of cu - fe thin films were measured by means of vibrating sample magnetometer ( vsm ). in addition, the giant magnetoresistance ( gmr ) effects of different films were also measured. the original resistance of the film fabricated by a direction - current magnetron sputtering system is directly affected by bias voltage

    利用掠入射x射線分析（ gixa ）技術對不同cu - fe薄膜的相結構進行了研究;利用xrd掃描及不同角度的2掃描對薄膜進行了結晶織構及殘余應力分析;運用小角x射線散射（ saxs ）技術測量了薄膜的厚度;採用原子力顯微鏡（ afm ）觀察了薄膜的表面形貌;運用能量損失譜（ eds ）及x射線熒光光譜（ xrf ）對薄膜進行了成分標定;使用振動樣品磁強計測量了不同cu - fe過飽和固溶體薄膜的磁性能;最後利用自製的磁阻性能測試設備測量了真空磁場熱處理前後不同薄膜的巨磁阻值。
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