零件相觸 的英文怎麼說

中文拼音 [língjiànxiāngchù]
零件相觸 英文
parts touch
  • : Ⅰ數詞1 (零數) zero2 (數的空位) zero sign (0); nought 3 (表示沒有數量;無) nil; nought 4 (...
  • : Ⅰ量詞(用於個體事物) piece; article; item Ⅱ名詞1. (指可以一一計算的事物) 2. (文件) letter; correspondence; paper; document
  • : 相Ⅰ名詞1 (相貌; 外貌) looks; appearance 2 (坐、立等的姿態) bearing; posture 3 [物理學] (相位...
  • : Ⅰ動詞1 (接觸) touch; contact 2 (碰; 撞) strike; hit 3 (觸動) touch 4 (感動) move sb ; sti...
  • 零件 : [工業] part; element; detail; component; finding; section; spare part; spare; fitting; ancillary...
  1. In the system, the collimation semiconductor laser - scanned beam scanning two perpendiculars direct of one plane of the measured workpiece at the same time is made. the beams with the dimension information of two perpendiculars direct are processed by the scanning receive system, the high - speed photoelectric transition and electronic data process. two measured results of the diametric directs and ellipse tolerance, etc, parameter, of the turning workpiece on the same plane are obtained by non - contact automatic measurement

    在單向激光掃描檢測技術的基礎之上,提出了一種雙向激光掃描檢測系統,其採用激光掃描檢測技術與特殊光學系統結合,用準直半導體激光掃描光束對被測工徑向某一截面的兩個互垂直方向同時掃描,經掃描接收光學系統、高速光電變換、電子學系統和微機數據處理系統,對將攜帶有垂直方向被測量信息的光束進行處理,實現了回轉體工同一截面兩個垂直方向的徑向尺寸和橢圓度等參數的非接自動測量,解決了同時非接測量回轉體同一截面兩個徑向尺寸的難題,它具有高速,高精度和非接自動測量等特點。
  2. Seraphim engineering co., electronic component distributor solution provider - camera - trigger coils

    幸賀股份有限公司,電子經銷解決方案提供. -機-發線圈
  3. The microprocessor is used to realize digital control as flip plus of the scr. the ic chip sa866ae of mitel company is utilized as the low frequency signal generator of the system. furthermore in the zero - current detection circuit, use the photocoupler gaalas ired and photo ic to detect zero - current, furthest shorten the commutating " died region ", prevent the current from distorting

    設計中採用單片機控制可控硅的發脈沖,實現數字化控制,並利用mitel公司的三pwm交流電機脈寬調制晶元sa866ae ,成功研製了交-交頻器中的低頻信號發生器裝置,效果良好;此外利用用光電檢測元進行系統電流的檢測,盡可能地縮短換死區,防止電流發生畸變,成功地解決了原有低頻電源系統中存在的兩大難題。
  4. It is widely used to measure optical element, optical system, detection of optical surface and the physical quantities ( such as field of temperature, field of density ) related with optical path difference. the underlying measurement principle of psi is to determine the phase of the intensity signal in interferogram received at each pixel of an imaging device

    干涉術( psi )作為快速、非接的精密測量手段,已經廣泛地應用於光學、光學系統、精密表面檢測和其它一些與光程差參數關的物理量的測量(如溫度場、密度場等) 。
  5. The intersecting and touching relationship of the assembly parts are distinguished

    檢測到干涉后,對關鍵的碰撞區域進一步分析,以區分間接交。
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