顯微光譜儀 的英文怎麼說

中文拼音 [xiǎnwéiguāng]
顯微光譜儀 英文
microspectrograph
  • : Ⅰ形容詞1 (明顯) apparent; obvious; noticeable; evident 2 (有名聲有權勢的) illustrious and inf...
  • : Ⅰ名詞1 (照耀在物體上、使人能看見物體的一種物質) light; ray 2 (景物) scenery 3 (光彩; 榮譽) ...
  • : Ⅰ名詞[書面語]1 (按類別或系統編成的書或冊子等) table; chart; register 2 (指導練習的格式或圖形)...
  • : 名詞1 (人的外表) appearance; bearing 2 (禮節; 儀式) ceremony; rite 3 (禮物)present; gift 4 ...
  • 顯微 : microadiography
  1. Equipment and instruments : electronic analytic balance, uv and vis spectrophotometer, 97rt fluorescence spectrophotometer, gas chromatograph spectrometer, high speed centrifugal machines, leica rm 2015 microtome, fluorescence microscopes, pcr amplifier, and so on

    :電子分析天平、紫外可見度計、 97rt熒度計、氣相色(附4種檢測器) 、高速離心機、病理切片機、熒鏡、 pcr擴增等。
  2. The types of the detection equipments and apparatus are over 100, such as x - ray detector, r - ray detector, digital ultrasonic flaw detector, eddy current flaw detector, eddy current flaw detector, magnetic memory metal diagnostic instrument, acoustic emission testing an analyzing system, three - dimensional ultrasonic testing system, microcomuterhydraulic pressureniversal testing machine, metalloscope, portable direct - read spectrograph, have achieved the national advanced technology

    擁有各種檢測設備100多套,如射線探傷機、數字式超聲波探傷、渦流探傷、磁記憶金屬診斷、聲發射檢測及分析系統、三維超聲波檢測系統、便攜式直讀機式液壓萬能試驗機、金相鏡等,達到國內先進水平。
  3. The cenosphere particles were characterized with optical microscope, field emission scanning electron microscopy ( fesem ), energy - dispersive spectroscopy ( eds ) and x - ray diffraction ( xrd ) in and after the plating

    鏡、場發射掃描電子鏡、能和x射線衍射對其進行了分析表徵。
  4. The epitaxial growths of ingaas / gaas / algaas fundamental material and the fabrication of 45 - deflector are extensively studied in our work. some measuring methods are used to evaluate the growth quality of our grown structure by pl, cv, x - ray double crystal diffraction, sem etc. property analysis are provided for it

    利用高能電子衍射、電化學c - v 、掃描電鏡( sem ) 、 x射線雙晶衍射( pl ) 、原子力鏡等多種方法對制備的器件進行了檢測,同時對實驗結果進行了必要的分析。
  5. The components, microstructure, luminousness, thickness and surface topography of the films were analysised via xrd, uv ? vis, xps, ellipsometric examination and stm. the photocatalytic properties of these fims are characterized by the decomposition rate of methylene blue or rhodamine b. the effect of sputtering power, temperature, o2 mass flow, bias, w - doping and sputtering time on photocatalytic properties are discussed

    採用x射線衍射、紫外-可見度計、 x電子能、薄膜厚度測試及掃描探針鏡等測試手段,研究分析了薄膜的組分、結構、透率、膜厚和表面形貌等。
  6. All my samples with good orientation are prepared by rf sputtering. then we invest surface morphology and crystal structure, optical and electrical properties of zno films by afm, xrd, hall testing, ultraviolet - visible spectrum photometer and xps et al. zno films are fabricated on gaas substrate

    本文用射頻反應磁控濺射制備了高度c軸擇優取向的zno薄膜,採用原子力鏡( afm ) 、 x射線( xrd ) 、 hall測試、紫外?可見分度計和x電子能等分析測試手段,研究了樣品的表面形貌、晶體結構、學和電學性能等。
  7. Laser microspectral analyzer

    分析
  8. In order to discuss the friction and wear mechanisms of mos2 nanoparticles, it was analyzed that the chemical status of elements existed on the rubbed surface by x - ray photoelectron spectroscope, and it was observed that the surface topography of wear zone by scanning electron microscope

    通過x射線電子能( xps )分析磨痕表面元素的化學狀態,掃描電子鏡( sem )對磨痕的表面形貌進行分析,從而總結了納米二硫化鉬在n46機械油中的摩擦磨損機理。
  9. Current researches, applications, preparation and structure of si3n4 are summarized in this paper. a new conclusion is drawn that silicon wafer can react with nitrogen at the temperature higher than 1100 and in super - pure nitrogen by direct - nitridation of silicon at the temperature from 800 to 1200. the prepared silicon nitride samples are tested by xps ( x - ray photoelectron spectroscopy ), sem ( scanning electron microscopy ), optical microscopy, xrd ( x - ray diffraction ) and edx ( energy dispersive x - ray analysis )

    通過矽片在800到1200各個溫度和各種氮氣氣氛下的氮化處理的實驗結果,報道了不同與其他研究者的氮化條件,矽片在氮氣保護的熱處理中的氮化條件為:高於1100的溫度和高純氮的氣氛條件,同時對該氮化硅薄膜進行了金相鏡、掃描電鏡( sem ) 、 x射線衍射( xrd ) 、 x射線電子( xps ) 、 x射線能( edx )和抗氧化性等測試和分析。
  10. Various factors affecting the refractive index and the deposition rate of the deposited films are studied to optimize growth conditions of the films. the microstructures and optical properties of the films are characterized by a prism coupler, a fourier transform infrared spectroscopy ( ftir ) and an atom force microscopy ( afm )

    研究了薄膜折射率和淀積速率與工藝參數之間的關系,通過棱鏡耦合、傅立葉變換紅外、原子力鏡、掃描電子鏡等測試手段,分析了薄膜的結構和學特性。
  11. In examining samples, we measured composition and bonding by chemical analyzer and raman spectrum, and measured surface by atomic force microscope

    在試片的檢測部份,我們利用了化學分析電子及拉曼分析薄膜之元素組成及其鍵結,並且用原子力鏡觀察其表面形貌。
  12. Failure reasons of impellers in a pump of an aromatic hydrocarbon extracting system were analyzed by means of microcoulometric detector, spectroscopic methodology, optical microscopy, scanning electron microscope and x ray diffraction

    摘要採用庫侖法、法、鏡、掃描電鏡、 x射線衍射等手段對芳烴抽提系統的3105泵葉輪進行了失效分析。
  13. The company has the advanced precision casting, the machine - finishing equipment and the check - out facility, including : disk wax mould machine, moistening slurry machine, intermediate frequency melting furnaces, cnc tooling machine, spectrometer, metallurgical microscope, hardness testing machine, computer material test machine. and so on

    公司擁有先進的精密鑄造、機械加工設備及檢測設備,其中包括:雙工位射蠟機、圓盤射蠟機、沾漿機、中頻熔化電爐,分析、金相鏡、硬度試驗機、電腦萬能材料試驗機, cnc數控車床、普通鉆銑床及閥門管件殼體、密封試驗機等。
  14. Using the microwave selective heating property for materials, by setup equivalent equation, and first time inducing the electromagnetic field perturbation theory to the design of heating materials for substrate in mpcvd, three temperature distribution modes were established, including temperature distribution comprehensive mode of inhomogeneous plasma, temperature distribution composite mode of composite substrate materials, temperature distribution perturbation mode of composite materials, which ii provided an whole new technology route to the design of substrate heating system in mpcvd and guided the preparation of heating materials for substrate. and then the heating materials for substrate were designed and optimized to obtain large area homogeneous temperature distribution even larger than substrate holder ' s diameter. as an important part, this thesis researched the nucleation and growth of diamond films in mpcvd, systematically researched the effects of substrate pretreatment, methane concentration, deposition pressure and substrate temperature etc experimental technologic parameters on diamond films " quality on ( 100 ) single crystal silicon substrate in the process of mpcvd, characterized the films qualities in laser raman spectra ( raman ), x - ray diffraction ( xrd ), scanning electron microscopy ( sem ), infrared transmission spectra ( ir ), atomic force microscopy ( afm ), determined the optimum parameters for mpcvd high quality diamond in the mpcvd - 4 mode system

    該系統可通過沉積參數的精確控制,以控制沉積過程,減少金剛石膜生長過程中的缺陷,並採用檢測分析等離子體的可見以監測波等離體化學氣相沉積過程;利用波對材料的選擇加熱特性,通過構造等效方程,並首次將電磁場攝動理論引入到mpcvd的基片加熱材料的設計中,建立了非均勻等離子體溫度場綜合模型、復合介質基片材料的復合溫度場模型及復合介質材料溫度場攝動模型,為mpcvd的基片加熱系統設計提供了一條全新的技術路線以指導基片加熱材料的制備,並對基片加熱材料進行了設計和優選,以獲取大面積均勻的溫度場區,甚至獲得大於基片臺尺寸的均勻溫度區;作為研究重點之一,開展了波等離體化學氣相沉積金剛石的成核與生長研究,系統地研究了在( 100 )單晶硅基片上mpcvd沉積金剛石膜的實驗過程中,基片預處理、甲烷濃度、沉積氣壓、基體溫度等不同實驗工藝參數對金剛石薄膜質量的影響,分別用raman、 x射線衍射( xrd ) 、掃描電鏡( sem ) 、紅外透射( ir ) 、原子力鏡( afm )對薄膜進行了表徵,確立了該系統上mpcvd金剛石膜的最佳的實驗工藝參數。
  15. The sl401 circulating water refrigeration unit is mostly used as a supporting product for precision instrument facilities with the need of isothermal cooling water, for example, the x - ray diffractometer, fluorescence spectrometer, scanning microscope, laser, energy spectrometer, vacuum forming machine, high - frequency generator, mocvd, etc

    Sl401型循環水製冷機組主要為x射線衍射、熒、掃描鏡、激器、能、真空成型機、高頻機、 mocvd等需用恆溫冷卻水源的精密器設備的配套產品。
  16. The morphology and structure of ti - dlc films were investigated by high resolution electron microscopy ( hrem ), atomic force microscopy ( afm ), scanning electron microscopy ( sem ) and raman spectroscopy. the mechanical properties were investigated by a mts nano indenter xp system with a berkovich indenter. the ti - dlc film with a titanium content of 27at. %

    利用高分辨電子鏡( hrem ) 、原子力鏡( afm ) 、掃描電鏡( sem )和拉曼等手段分析了沉積ti - dlc薄膜的成分、形貌和結構,使用帶berkovich壓頭的納米壓痕( mtsnanoindenterxp )測試了薄膜的力學性能。
  17. The tungsten oxide films with catalyst by two methods were characterized by x - diffractometer, tunnel scan - atomic force microscope, ft - ir, double - beam uv - vis - nir spectrophotometer and speediness volt - ampere cycle meter. as results of x - diffractometer, pt / wo3 sputtered film samples are crystal when annealed at 400 with distinct diffractive acuti - apices

    本文分別用x衍射、隧道-原子力鏡、傅立葉變換紅外、雙束紫外可見分度計、快速伏安循環法等表徵了用以上兩種方法制備的三氧化鎢摻雜薄膜。
  18. In the present dissertation, nanocomposite thin films and extended molecular devices were prepared via the electrostatic self - assembly monolayer technique. the structures and the properties of the thin films were studied by uv - vis spectroscopy, x - ray diffraction spectroscopy, x - ray photoelectron spectroscopy, laser raman spectroscopy, atomic force microscopy, fiber optic experimental setups and so on. a novel fiber optic humidity sensor based on the self - assembled polyelectrolyte multilayer thin films was presented, and other thin film devices were also described

    在對納米復合薄膜研究的重要性及自組裝薄膜技術的發展動態進行綜合分析的基礎上,開展了利用靜電吸附自組裝技術制備納米復合薄膜及廣義的分子器件的研究,採用紫外-可見、 x射線衍射、 x射線電子能、激拉曼、原子力鏡、學系統等研究了復合薄膜的結構與性能,研製了一種纖濕度傳感器和其他薄膜器件。
  19. Have 1 - 2 years the equipments instruments operation experience, such as : environment chamber, hardness tester, microscope, ftir others

    有1 - 2年器設備操作經驗,如:環境試驗箱,硬度計,鏡,紅外以及其他相關材料測試設備。
  20. Have 1 - 2 years the equipments and instruments operation experience, such as : environment chamber, hardness tester, microscope, ftir and others

    有1 - 2年器設備操作經驗,如:環境試驗箱,硬度計,鏡,紅外以及其他相關材料測試設備。
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