epitaxial method 中文意思是什麼
epitaxial method
解釋
外延法-
Test method for resistivity of silicon epitaxial layers by area contacts three - probe techniques
硅外延層電阻率的面接觸三探針.測試方法 -
Testing of semi - conductive inorganic materials ; measuring the thickness of silicon epitaxial layer thickness by infrared interference method
半導體無機材料的試驗.用紅外線干涉法測量硅外延生長 -
The novel method of liquid phase epitaxial growth process of p - sic from p - sic film on si substrate in c - saturated si solvent is further investigated. some processes of acquiring the fundamental technical parameters and some solution to some critical technical problems are introduced. especially, the optimized technical schemes of effectively restraining such a - sic polytypes as gh - sic coring and growing in p - sic epitaxial growth process is presented
對利用硅襯底上的- sic薄膜從碳飽和硅熔體中外延生長- sic晶體的創新方法進行了工藝探索，介紹了基本工藝參數的獲取過程和幾個關鍵工藝問題的解決方法，特別是提出了通過工藝條件的調控來有效抑制6h - sic等型同質異構體在- sic生長過程中成核生長的工藝方案。 -
Gallium arsenide epitaxial layer - determination of carrier concentration - voltage - capacitance method
砷化鎵外延層載流子濃度電容-電壓測量方法 -
Main content of the thesis are also given in the introduction. the thesis presented three different of the residual stress based on x - ray diffraction - - two - exposure method, sin2, high - resolution reciprocal space mapping, which are applied to investigate the residual stress state of pt / ti bottom electrode stack, polycrystalline pzt ferroelectric thin films and epitaxial laalo3 / batio3 ferroelectric
基於此，提出了本文的選題依據，即研究鐵電薄膜中的殘余應力是基於「鐵電薄膜的重要應用背景和殘余應力對鐵電薄膜性能的可能影響以及目前鐵電薄膜中殘余應力研究的不足」 。 -
Test method for detection of epitaxial spikes
檢測外延峰值的試驗方法
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